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Novel Model Calibration Method Based on Differential Evolution Used for SCR Model Fitting

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F13%3A00211979" target="_blank" >RIV/68407700:21230/13:00211979 - isvavai.cz</a>

  • Result on the web

    <a href="http://dx.doi.org/10.1109/DDECS.2013.6549840" target="_blank" >http://dx.doi.org/10.1109/DDECS.2013.6549840</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1109/DDECS.2013.6549840" target="_blank" >10.1109/DDECS.2013.6549840</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Novel Model Calibration Method Based on Differential Evolution Used for SCR Model Fitting

  • Original language description

    This paper presents the possibility to use modern and very effective optimization algorithm called differential evolutionary optimization algorithm (DEOA) enhanced by Nelder--Mead Simplex algorithm (NMSA) for fully automatic ESD protection model calibration. This novel method requires only TLP measurement of specific protection device for optimal model calibration. Presented approach is currently being actively developed by authors and tested for various ESD protection devices to verify its robustness. It was in past successfully tested on electrostatic discharge (ESD) MOSFET cite{ja2}. Description of used macro-model and novel calibration method along with results of ESD Silicon-controlled rectifier (SCR) macro-model calibration to empirical data are presented.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

  • OECD FORD branch

    20201 - Electrical and electronic engineering

Result continuities

  • Project

  • Continuities

    S - Specificky vyzkum na vysokych skolach

Others

  • Publication year

    2013

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Proc. of the 16th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems

  • ISBN

    978-1-4673-6135-4

  • ISSN

    2334-3133

  • e-ISSN

  • Number of pages

    2

  • Pages from-to

    297-298

  • Publisher name

    NOVPRESS

  • Place of publication

    Brno

  • Event location

    Karlovy Vary

  • Event date

    Apr 8, 2013

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article

    000325168900066