Comparison of Waffle and standard gate pattern base on specific on-resistance
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F14%3A00221497" target="_blank" >RIV/68407700:21230/14:00221497 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Comparison of Waffle and standard gate pattern base on specific on-resistance
Original language description
Comparison of Waffle and standard gate pattern base on specific on-resistance,Comparison of Waffle and standard gate pattern base on specific on-resistance
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
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Continuities
S - Specificky vyzkum na vysokych skolach
Others
Publication year
2014
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
ElectroScope
ISSN
1802-4564
e-ISSN
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Volume of the periodical
2014
Issue of the periodical within the volume
2014
Country of publishing house
CZ - CZECH REPUBLIC
Number of pages
4
Pages from-to
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UT code for WoS article
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EID of the result in the Scopus database
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