All

What are you looking for?

All
Projects
Results
Organizations

Quick search

  • Projects supported by TA ČR
  • Excellent projects
  • Projects with the highest public support
  • Current projects

Smart search

  • That is how I find a specific +word
  • That is how I leave the -word out of the results
  • “That is how I can find the whole phrase”

Comparison of mechanical resistance of SnCu and SnBi of solder joints

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F17%3A00315797" target="_blank" >RIV/68407700:21230/17:00315797 - isvavai.cz</a>

  • Result on the web

    <a href="http://ieeexplore.ieee.org/document/8000924/" target="_blank" >http://ieeexplore.ieee.org/document/8000924/</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1109/ISSE.2017.8000924" target="_blank" >10.1109/ISSE.2017.8000924</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Comparison of mechanical resistance of SnCu and SnBi of solder joints

  • Original language description

    Mechanical stress act on solder joints during transport, function and storage of the electronic equipment. Therefore, the knowledge of solder joints resistance against it is very useful. This article deals with comparison of mechanical resistance of SnCu0,7 and Sn42Bi58 solder alloys. The experiments were based on two PCBs (smaller and larger one, with soldering pads designed according to commonly used chip package) which were soldered together. Surface finishes of soldering pads were OSP, ENIG and HASL. Mechanical test were based on sharp tip, which were driving between two PCBs. From overall point of view a slightly better results were achieved for Sn42Bi58 solder alloy. Additionally the thicknesses of intermetallic layers were compared and voids frequency inside solder joints were inspected.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

  • OECD FORD branch

    20201 - Electrical and electronic engineering

Result continuities

  • Project

  • Continuities

    S - Specificky vyzkum na vysokych skolach

Others

  • Publication year

    2017

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    40th International Spring Seminar on Electronics Technology (ISSE)

  • ISBN

    978-1-5386-0582-0

  • ISSN

    2161-2536

  • e-ISSN

  • Number of pages

    4

  • Pages from-to

  • Publisher name

    IEEE

  • Place of publication

    New York

  • Event location

    Sofia

  • Event date

    May 10, 2017

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article

    000426973000047