Automatic characterisation method for statistical evaluation of tin whisker growth
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F17%3A00316563" target="_blank" >RIV/68407700:21230/17:00316563 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1016/j.microrel.2017.04.007" target="_blank" >http://dx.doi.org/10.1016/j.microrel.2017.04.007</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.microrel.2017.04.007" target="_blank" >10.1016/j.microrel.2017.04.007</a>
Alternative languages
Result language
angličtina
Original language name
Automatic characterisation method for statistical evaluation of tin whisker growth
Original language description
In this paper, an automatic method was developed to characterise whisker growth quantitatively in SEM images. The key step of the automatic methods in this case is the determination of the optimal threshold value for image segmentation, i.e. separation of the objects (whiskers) from the background (substrate). A thresholding method was developed for this purpose and was compared to manual and to general purpose automatic methods as references. As it was proven in previous studies the vacuum deposited tin layers on copper substrates can produce numerous tin whiskers in various shapes and lengths in a short time. This layer deposition technology was therefore chosen for the comparison of the thresholding methods. Images of the produced whiskers were captured by a FEI Inspect S50 Scanning Electron Microscope. By executing the automatic methods in the captured images, the area density of the whiskers, and the maximum and the mean length of the whiskers were measured. Based on the results of area density, the automatic methods were compared to manual counting and the Mean Absolute Percentage Error (MAPE) was determined. Finally, the reference automatic methods were compared to the self-developed method from the maximum and mean length of whiskers point of view
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
20201 - Electrical and electronic engineering
Result continuities
Project
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Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2017
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Microelectronics Reliability
ISSN
0026-2714
e-ISSN
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Volume of the periodical
73
Issue of the periodical within the volume
JUN
Country of publishing house
NL - THE KINGDOM OF THE NETHERLANDS
Number of pages
8
Pages from-to
14-21
UT code for WoS article
000403512300002
EID of the result in the Scopus database
2-s2.0-85019689980