Thick Film Structure – Influence of Pattern Geometry

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F18%3A00327193" target="_blank" >RIV/68407700:21230/18:00327193 - isvavai.cz</a>

Result on the web

<a href="http://147.228.94.30/images/PDF/Rocnik2018/Cislo1_2018/r12c1c1.pdf" target="_blank" >http://147.228.94.30/images/PDF/Rocnik2018/Cislo1_2018/r12c1c1.pdf</a>

DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Thick Film Structure – Influence of Pattern Geometry

Original language description

The article concern with the topic of thick-film structures prepared by screen printing. Work is focused on analysis the influence of different types of polymer paste and preparation technology of layer on the pattern geometry. Set of samples of test structure with different sizes and shapes were printed on ceramics substrates. Measured parameters were the electrical resistance and the dimensions of the layers. Deviations from the theoretical width values for each type of paste were analyzed and compared. The path width was measured by optical microscope and the thickness of the layers by the stylus method.

Czech name

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Czech description

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Type

J_ost - Miscellaneous article in a specialist periodical

CEP classification

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OECD FORD branch

20201 - Electrical and electronic engineering

Project

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Continuities

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year

2018

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

ElectroScope

ISSN

1802-4564

e-ISSN

1802-4564

Volume of the periodical

2018

Issue of the periodical within the volume

1

Country of publishing house

CZ - CZECH REPUBLIC

Number of pages

4

Pages from-to

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UT code for WoS article

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EID of the result in the Scopus database

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