Radiation Defects Created in n-Type 4H-SiC by Electron Irradiation in the Energy Range of 1-10 MeV

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F19%3A00332048" target="_blank" >RIV/68407700:21230/19:00332048 - isvavai.cz</a>
Result on the web
<a href="https://doi.org/10.1002/pssa.201900312" target="_blank" >https://doi.org/10.1002/pssa.201900312</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1002/pssa.201900312" target="_blank" >10.1002/pssa.201900312</a>

Result language
angličtina
Original language name
Radiation Defects Created in n-Type 4H-SiC by Electron Irradiation in the Energy Range of 1-10 MeV
Original language description
Radiation damage produced in 4H–SiC n–epilayers by electrons of different energies is presented. Junction Barrier Schottky power SiC diodes were irradiated with 1.05, 2.1, 5 and 10 MeV electrons with doses up to 600 kGy. Radiation defects are characterized by capacitance deep-level transient spectroscopy and C-V measurement. The stability of introduced defects and their effect on carrier lifetime reduction is discussed, as well.
Czech name
—
Czech description
—

Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
—
OECD FORD branch
20201 - Electrical and electronic engineering

Project
<a href="/en/project/GAP102%2F12%2F2108" target="_blank" >GAP102/12/2108: Defects in Wide-Bandgap Semiconductors and Their Impact on Power and High-Temperature Electronics</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2019
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE
ISSN
1862-6300
e-ISSN
1862-6319
Volume of the periodical
216
Issue of the periodical within the volume
17
Country of publishing house
DE - GERMANY
Number of pages
7
Pages from-to
—
UT code for WoS article
000479458000001
EID of the result in the Scopus database
2-s2.0-85069874075

Similar results(10)