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mu-CT investigation of tin whisker growth mechanisms

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F20%3A00343670" target="_blank" >RIV/68407700:21230/20:00343670 - isvavai.cz</a>

  • Alternative codes found

    RIV/68407700:21670/20:00343670

  • Result on the web

    <a href="https://doi.org/10.1088/1748-0221/15/02/C02043" target="_blank" >https://doi.org/10.1088/1748-0221/15/02/C02043</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1088/1748-0221/15/02/C02043" target="_blank" >10.1088/1748-0221/15/02/C02043</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    mu-CT investigation of tin whisker growth mechanisms

  • Original language description

    The current paper considers the applicability of micro-tomographic methods for the investigation of growth mechanisms of metallic tin whiskers. Tin whiskers are metallic fibers that grow spontaneously from lead-free tin-coated surfaces, causing short circuit related issues in electronic devices, therefore making this phenomenon an interesting topic for in-depth analysis. In order to investigate such minuscule structures by X-rays, a tomographic setup employing a direct-converting pixel large area detector based on the Timepix readout ASIC is used. Featuring an extraordinary contrast and high dynamic range, these detectors have proven to be powerful tools in the analysis of samples containing fine features of low radiographic absorption.Initial tomographic results reveal fully 3D morphological information on tin whiskers, albeit at lower spatial resolution than by scanning electron microscope (SEM), which is the commonly used method to investigate this phenomenon. However, the additional morphological information obtained by micro-tomography gives additional means of analysis, likely to help understand the underlying growth mechanisms.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    20201 - Electrical and electronic engineering

Result continuities

  • Project

  • Continuities

    V - Vyzkumna aktivita podporovana z jinych verejnych zdroju

Others

  • Publication year

    2020

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Journal of Instrumentation

  • ISSN

    1748-0221

  • e-ISSN

    1748-0221

  • Volume of the periodical

    15

  • Issue of the periodical within the volume

    2

  • Country of publishing house

    IT - ITALY

  • Number of pages

    7

  • Pages from-to

  • UT code for WoS article

    000527943500043

  • EID of the result in the Scopus database

    2-s2.0-85087548835