Programmable 1 A ultra-low dropout LDO regulator for high-resolution camera sensors
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F23%3A00369223" target="_blank" >RIV/68407700:21230/23:00369223 - isvavai.cz</a>
Result on the web
<a href="https://doi.org/10.1016/j.mejo.2023.105899" target="_blank" >https://doi.org/10.1016/j.mejo.2023.105899</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.mejo.2023.105899" target="_blank" >10.1016/j.mejo.2023.105899</a>
Alternative languages
Result language
angličtina
Original language name
Programmable 1 A ultra-low dropout LDO regulator for high-resolution camera sensors
Original language description
In this article, design and realization of a high-performance linear low dropout regulator (LDO) capable of supplying 1 A of output current, designed and fabricated in 180 nm BCD technology of STMicroelectronics company, is described. The main purpose of this device is providing a stable output voltage for supplying highresolution sensors of cameras in cellphones. The LDO is equipped with a big N-channel power transistor allowing an ultra-low dropout voltage around 50 mV at the maximal load current of 1 A even with a very low level of the output voltage of only 0.4 V. These features make the device suitable as a block following buck switching converters. Emphasis has been laid on assuring 1% accuracy of the output voltage across full temperature range and line and load conditions, very low quiescent current around 32 & mu;A, necessary for battery powered applications such as cellphones, good transient response and a high power supply rejection ratio (PSRR) of more than 85 dB at 1 kHz. This combination of high-level parameters stands for an extraordinary device. The proposed LDO is a programmable device which means that the output voltage (up to 100 voltage versions in total) and other functions can be set via post-package electrical trimming. Last but not least, an efficient design for testability (DFT) is implemented in order to reduce the failed parts to a very low level, guaranteeing the highest quality level needed in the market.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
20201 - Electrical and electronic engineering
Result continuities
Project
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Continuities
S - Specificky vyzkum na vysokych skolach
Others
Publication year
2023
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Microelectronics Journal
ISSN
0026-2692
e-ISSN
1879-2391
Volume of the periodical
139
Issue of the periodical within the volume
9
Country of publishing house
GB - UNITED KINGDOM
Number of pages
12
Pages from-to
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UT code for WoS article
001052501800001
EID of the result in the Scopus database
2-s2.0-85169907387