All

What are you looking for?

All
Projects
Results
Organizations

Quick search

  • Projects supported by TA ČR
  • Excellent projects
  • Projects with the highest public support
  • Current projects

Smart search

  • That is how I find a specific +word
  • That is how I leave the -word out of the results
  • “That is how I can find the whole phrase”

Effect of Temperature Shocks on the Resistance of Joints Formed of Conductive Adhesives

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F23%3A00371936" target="_blank" >RIV/68407700:21230/23:00371936 - isvavai.cz</a>

  • Result on the web

    <a href="https://doi.org/10.1109/ISSE57496.2023.10168314" target="_blank" >https://doi.org/10.1109/ISSE57496.2023.10168314</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1109/ISSE57496.2023.10168314" target="_blank" >10.1109/ISSE57496.2023.10168314</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Effect of Temperature Shocks on the Resistance of Joints Formed of Conductive Adhesives

  • Original language description

    Conductive adhesive joints were climatically aged with temperature pulses in the range of -40 to 115 oC. The joints were made of two types of electrically conductive adhesives. The joints were first exposed for 15 minutes in the hot chamber of the thermal pulse testing device, then moved within 8 seconds to the cold chamber and exposed again for 15 minutes. This cycle was repeated two hundred times and five hundred times. The connection resistance was measured using the four-point method. Exposure to temperature pulses was found to cause small changes only in junction resistance.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

  • OECD FORD branch

    20201 - Electrical and electronic engineering

Result continuities

  • Project

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2023

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    2023 46th International Spring Seminar on Electronics Technology (ISSE)

  • ISBN

    979-8-3503-3485-2

  • ISSN

    2161-2528

  • e-ISSN

    2161-2536

  • Number of pages

    4

  • Pages from-to

  • Publisher name

    IEEE Press

  • Place of publication

    New York

  • Event location

    Temešvár

  • Event date

    May 10, 2023

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article