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An Expired Solder Paste vs Fresh Solder Paste: Reliability and Sustainability in Electronics Manufacturing

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F24%3A00376744" target="_blank" >RIV/68407700:21230/24:00376744 - isvavai.cz</a>

  • Result on the web

    <a href="https://doi.org/10.1109/ISSE61612.2024.10604132" target="_blank" >https://doi.org/10.1109/ISSE61612.2024.10604132</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1109/ISSE61612.2024.10604132" target="_blank" >10.1109/ISSE61612.2024.10604132</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    An Expired Solder Paste vs Fresh Solder Paste: Reliability and Sustainability in Electronics Manufacturing

  • Original language description

    Two types of solder paste, where for each there were three production / expiry dates, were compared on a gas chromatography and evaluated in terms of their application using stencil printing on a copper substrate (OSP surface finish). The number, percentage, and number of macrovoids were evaluated and compared. Altogether, six solder paste samples were tested, for each solder paste, the voids were evaluated using X-ray spectroscopy on 14 pads with a 1206 pad size. Despite the results from the gas chromatography showed the effect of solder paste aging, the voiding of the pastes did not differ significantly and, on the contrary, the percentage representation of voids was the smallest with the oldest solder paste.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

  • OECD FORD branch

    20201 - Electrical and electronic engineering

Result continuities

  • Project

  • Continuities

    S - Specificky vyzkum na vysokych skolach

Others

  • Publication year

    2024

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    2024 47th International Spring Seminar on Electronics Technology (ISSE)

  • ISBN

    979-8-3503-8548-9

  • ISSN

    2161-2536

  • e-ISSN

  • Number of pages

    4

  • Pages from-to

  • Publisher name

    IEEE Press

  • Place of publication

    New York

  • Event location

    Praha

  • Event date

    May 15, 2024

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article

    001283808200071