METHOD OF EXAMINING A SAMPLE IN A SCANNING TUNNELING MICROSCOPE USING TIP-TO-SAMPLE DISTANCE VARIATIONS

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F25%3A00383068" target="_blank" >RIV/68407700:21230/25:00383068 - isvavai.cz</a>
Result on the web
<a href="https://worldwide.espacenet.com/patent/search/family/077447661/publication/US12253538B2?q=pn%3DUS12253538B2" target="_blank" >https://worldwide.espacenet.com/patent/search/family/077447661/publication/US12253538B2?q=pn%3DUS12253538B2</a>
DOI - Digital Object Identifier
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Result language
angličtina
Original language name
METHOD OF EXAMINING A SAMPLE IN A SCANNING TUNNELING MICROSCOPE USING TIP-TO-SAMPLE DISTANCE VARIATIONS
Original language description
The present invention relates to simultaneous constant height and constant current measurements which can be typically performed in a scanning tunneling microscope (STM) or in a combined atomic force microscope/scanning tunneling microscope (AFM/STM) microscope. Simultaneous Local Density of States Topography and potential barrier measurements in these microscopes are also disclosed. ### The patent is exploited by its owner.
Czech name
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Czech description
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Type
P - Patent
CEP classification
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OECD FORD branch
21002 - Nano-processes (applications on nano-scale); (biomaterials to be 2.9)

Project
<a href="/en/project/TP01010066" target="_blank" >TP01010066: ProoFOND</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2025
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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