METHOD OF EXAMINING A SAMPLE IN AN ATOMIC FORCE MICROSCOPE USING ATTRACTIVE TIP-TO-SAMPLE INTERACTION

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F25%3A00383069" target="_blank" >RIV/68407700:21230/25:00383069 - isvavai.cz</a>
Result on the web
<a href="https://worldwide.espacenet.com/patent/search/family/077411508/publication/US12253539B2?q=pn%3DUS12253539B2" target="_blank" >https://worldwide.espacenet.com/patent/search/family/077411508/publication/US12253539B2?q=pn%3DUS12253539B2</a>
DOI - Digital Object Identifier
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Result language
angličtina
Original language name
METHOD OF EXAMINING A SAMPLE IN AN ATOMIC FORCE MICROSCOPE USING ATTRACTIVE TIP-TO-SAMPLE INTERACTION
Original language description
This invention relates to a non-contact atomic force microscopy (AFM) method which considers attractive interaction between the tip and the sample to stop the approach between the tip and the sample before the contact between them and thus to reduce the amount of the tip-to-sample contacts and the tip-to-sample interaction forces. ### The patent is exploited by its owner.
Czech name
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Czech description
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Type
P - Patent
CEP classification
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OECD FORD branch
21002 - Nano-processes (applications on nano-scale); (biomaterials to be 2.9)

Project
<a href="/en/project/TP01010066" target="_blank" >TP01010066: ProoFOND</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2025
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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