A New Method for Speficication of Parameters to Path Delay Fautls Testing
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21240%2F15%3A00230491" target="_blank" >RIV/68407700:21240/15:00230491 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
A New Method for Speficication of Parameters to Path Delay Fautls Testing
Original language description
Technology scaling and manufacturing process affect the performance of digital circuits, making them more vulnerable to environmental influences. Some defects are shown as delay faults, therefore their testing is very important, mainly for path delay faults. Such faults are tested over critical paths which have to be specified in a digital circuit. A problem of the critical paths selection is discussed in this paper. Some various factors have impact to signal propagation delay. A new method is presentedfor determining the measurement of the parameters impact on the path delay in the digital circuit. The method is focused to find the best weights of parameters for system PaCGen (Parameterized Critical Path Generator). The PaCGen is system for criticalpaths selection based on static timing analysis data with impact of factors to propagation delay. Accordingly, the critical paths are selected to be used for simulating fault coverage of path delay faults on transition delay fault model.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JC - Computer hardware and software
OECD FORD branch
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Result continuities
Project
<a href="/en/project/7AMB14SK177" target="_blank" >7AMB14SK177: Verification and dependability of digital systems design</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2015
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Proceedings of the 3rd Prague Embedded Systems Workshop
ISBN
978-80-01-05776-6
ISSN
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e-ISSN
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Number of pages
7
Pages from-to
26-32
Publisher name
ČVUT FIT, Katedra číslicového návrhu
Place of publication
Praha
Event location
Roztoky u Prahy
Event date
Jul 2, 2015
Type of event by nationality
EUR - Evropská akce
UT code for WoS article
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