The Effect of the Transient Faults in Dependability Prediction
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21240%2F16%3A00301389" target="_blank" >RIV/68407700:21240/16:00301389 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1109/DSD.2016.73" target="_blank" >http://dx.doi.org/10.1109/DSD.2016.73</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1109/DSD.2016.73" target="_blank" >10.1109/DSD.2016.73</a>
Alternative languages
Result language
angličtina
Original language name
The Effect of the Transient Faults in Dependability Prediction
Original language description
Markov chain models are used to evaluate the dependability properties (reliability, safety, availability, maintainability etc.) of the mission-critical systems. Dependability models are often focused only on the basic stuck-at faults. On the other hand the transient faults are present in the operational environment but not included in the dependability prediction. The aim of this paper is to show how the transient faults influence the dependability prediction using the Markov chain model. In this paper basic TMR Markov chain model using stuck-at faults is compared to our extended TMR model considering both the stuck-at and transient faults. The main focus is given on the calculation of the dependability parameter lambda (i.e. the failure rate of the system).
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
IN - Informatics
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GA16-05179S" target="_blank" >GA16-05179S: Fault-Tolerant and Attack-Resistant Architectures Based on Programmable Devices: Research of Interplay and Common Features</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2016
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Proceedings of 19th Euromicro Conference on Digital System Design DSD 2016
ISBN
978-1-5090-2816-0
ISSN
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e-ISSN
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Number of pages
5
Pages from-to
9-13
Publisher name
IEEE Computer Soc.
Place of publication
Los Alamitos, CA
Event location
Limassol, Cyprus
Event date
Aug 31, 2016
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
000386638800002