The effect of the transient faults in dependability prediction
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21240%2F17%3A00316522" target="_blank" >RIV/68407700:21240/17:00316522 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1016/j.micpro.2017.05.004" target="_blank" >http://dx.doi.org/10.1016/j.micpro.2017.05.004</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.micpro.2017.05.004" target="_blank" >10.1016/j.micpro.2017.05.004</a>
Alternative languages
Result language
angličtina
Original language name
The effect of the transient faults in dependability prediction
Original language description
Markov chain models are used to evaluate the dependability properties (reliability, safety, availability, maintainability etc.) of the mission-critical systems. Dependability models are often focused only on the basic stuck-at faults. On the other hand the transient faults are present in the operational environment but not included in the dependability prediction. The aim of this paper is to show how the transient faults influence the dependability prediction using the Markov chain model. In this paper basic TMR Markov chain model using stuck-at faults is compared to our extended TMR model considering both the stuck-at and transient faults. The main focus is given on the calculation of the dependability parameter lambda (i.e. the failure rate of the system).
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
20206 - Computer hardware and architecture
Result continuities
Project
<a href="/en/project/GA16-05179S" target="_blank" >GA16-05179S: Fault-Tolerant and Attack-Resistant Architectures Based on Programmable Devices: Research of Interplay and Common Features</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2017
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Microprocessors and Microsystems
ISSN
0141-9331
e-ISSN
1872-9436
Volume of the periodical
52
Issue of the periodical within the volume
C
Country of publishing house
NL - THE KINGDOM OF THE NETHERLANDS
Number of pages
7
Pages from-to
498-504
UT code for WoS article
000407984000044
EID of the result in the Scopus database
2-s2.0-85019384073