Dependability Prediction Involving Temporal Redundancy and the Effect of Transient Faults

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21240%2F17%3A00312908" target="_blank" >RIV/68407700:21240/17:00312908 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1109/DSD.2017.77" target="_blank" >http://dx.doi.org/10.1109/DSD.2017.77</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1109/DSD.2017.77" target="_blank" >10.1109/DSD.2017.77</a>

Result language
angličtina
Original language name
Dependability Prediction Involving Temporal Redundancy and the Effect of Transient Faults
Original language description
Dependability models are focused only on the basic stuck-at faults. In previous work a method has been shown on how to calculate dependability prediction using Markov chain models. This method has been described using the TMR architecture. In this paper a similar method for calculating the dependability parameter lambda (i.e., the failure rate of the system) is proposed. Focus is given on the dependability prediction using the temporal redundancy considering both stuck-at and transient faults.
Czech name
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Czech description
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Project
<a href="/en/project/GA16-05179S" target="_blank" >GA16-05179S: Fault-Tolerant and Attack-Resistant Architectures Based on Programmable Devices: Research of Interplay and Common Features</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2017
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
Proc. of the 20th Euromicro Conference on Digital System Design
ISBN
978-1-5386-2146-2
ISSN
—
e-ISSN
—
Number of pages
4
Pages from-to
360-363
Publisher name
IEEE
Place of publication
Piscataway, NJ
Event location
Vienna
Event date
Aug 30, 2017
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
000427097100051

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