Optically induced static power in combinational logic: Vulnerabilities and countermeasures
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21240%2F21%3A00350799" target="_blank" >RIV/68407700:21240/21:00350799 - isvavai.cz</a>
Result on the web
<a href="https://doi.org/10.1016/j.microrel.2021.114281" target="_blank" >https://doi.org/10.1016/j.microrel.2021.114281</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.microrel.2021.114281" target="_blank" >10.1016/j.microrel.2021.114281</a>
Alternative languages
Result language
angličtina
Original language name
Optically induced static power in combinational logic: Vulnerabilities and countermeasures
Original language description
Physical attacks, namely invasive, observation, and combined, represent a great challenge for today's digital design. Successful class of strategies adopted by industry, allowing hiding data dependency of the side channel emissions in CMOS is based on balancing. Although attacks on CMOS dynamic power represent a class of state-of-the-art attacks, vulnerabilities exploiting data dependency in CMOS static power and light-modulated static power were recently presented. In this paper, we describe structures and techniques developed to enhance and balance the power imprint of the traditional static CMOS bulk structures under invasive light attack. The novel standard cells designed according to the presented techniques in the TSMC180nm technology node were used to synthesize the dual-rail AES SBOX block. The behavior of the AES SBOX block composed of the novel cells is compared to classical approaches. Usage of novel cells enhances circuit security under invasive light attack while preserving comparable circuit resistance against state-of-the-art power attacks.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
20206 - Computer hardware and architecture
Result continuities
Project
<a href="/en/project/EF16_019%2F0000765" target="_blank" >EF16_019/0000765: Research Center for Informatics</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2021
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Microelectronics Reliability
ISSN
0026-2714
e-ISSN
1872-941X
Volume of the periodical
124
Issue of the periodical within the volume
September
Country of publishing house
NL - THE KINGDOM OF THE NETHERLANDS
Number of pages
13
Pages from-to
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UT code for WoS article
000687970500013
EID of the result in the Scopus database
2-s2.0-85111710941