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Optically induced static power in combinational logic: Vulnerabilities and countermeasures

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21240%2F21%3A00350799" target="_blank" >RIV/68407700:21240/21:00350799 - isvavai.cz</a>

  • Result on the web

    <a href="https://doi.org/10.1016/j.microrel.2021.114281" target="_blank" >https://doi.org/10.1016/j.microrel.2021.114281</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1016/j.microrel.2021.114281" target="_blank" >10.1016/j.microrel.2021.114281</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Optically induced static power in combinational logic: Vulnerabilities and countermeasures

  • Original language description

    Physical attacks, namely invasive, observation, and combined, represent a great challenge for today's digital design. Successful class of strategies adopted by industry, allowing hiding data dependency of the side channel emissions in CMOS is based on balancing. Although attacks on CMOS dynamic power represent a class of state-of-the-art attacks, vulnerabilities exploiting data dependency in CMOS static power and light-modulated static power were recently presented. In this paper, we describe structures and techniques developed to enhance and balance the power imprint of the traditional static CMOS bulk structures under invasive light attack. The novel standard cells designed according to the presented techniques in the TSMC180nm technology node were used to synthesize the dual-rail AES SBOX block. The behavior of the AES SBOX block composed of the novel cells is compared to classical approaches. Usage of novel cells enhances circuit security under invasive light attack while preserving comparable circuit resistance against state-of-the-art power attacks.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    20206 - Computer hardware and architecture

Result continuities

  • Project

    <a href="/en/project/EF16_019%2F0000765" target="_blank" >EF16_019/0000765: Research Center for Informatics</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2021

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Microelectronics Reliability

  • ISSN

    0026-2714

  • e-ISSN

    1872-941X

  • Volume of the periodical

    124

  • Issue of the periodical within the volume

    September

  • Country of publishing house

    NL - THE KINGDOM OF THE NETHERLANDS

  • Number of pages

    13

  • Pages from-to

  • UT code for WoS article

    000687970500013

  • EID of the result in the Scopus database

    2-s2.0-85111710941