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A comparative study of the TID radiation effects on ASICs manufactured in 180 nm commercial technologies

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21340%2F18%3A00327024" target="_blank" >RIV/68407700:21340/18:00327024 - isvavai.cz</a>

  • Alternative codes found

    RIV/68378271:_____/18:00519329

  • Result on the web

    <a href="http://iopscience.iop.org/article/10.1088/1748-0221/13/12/C12003/meta" target="_blank" >http://iopscience.iop.org/article/10.1088/1748-0221/13/12/C12003/meta</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1088/1748-0221/13/12/C12003" target="_blank" >10.1088/1748-0221/13/12/C12003</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    A comparative study of the TID radiation effects on ASICs manufactured in 180 nm commercial technologies

  • Original language description

    The presented study compares the effects of ionizing radiation on circuit structures manufactured in a 180 nm bulk CMOS and 180 nm SoI MOS technology. Ahigh-flux Co-60 medical radiation source with a dose rate of 460 Gy.min(-1) was used. The specimens under irradiation were placed in a Pb/Al enclosure providing an approximate electron equilibrium. Besides the analog and digital circuits, the ASICs also contain transistor test structures for direct study of irradiation effects upon electronics. The integral characteristics of current consumption, shifts in transistor threshold voltage and leakage current increase observations have been made. The SoI technology was shown to be several orders of magnitude more sensitive to TID effects, but during irradiation, its properties had a tendency to return to normal.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    10301 - Atomic, molecular and chemical physics (physics of atoms and molecules including collision, interaction with radiation, magnetic resonances, Mössbauer effect)

Result continuities

  • Project

    <a href="/en/project/TE01020069" target="_blank" >TE01020069: Advanced Detection Systems of Ionizing Radiation</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2018

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Journal of Instrumentation

  • ISSN

    1748-0221

  • e-ISSN

    1748-0221

  • Volume of the periodical

    13

  • Issue of the periodical within the volume

    December

  • Country of publishing house

    IT - ITALY

  • Number of pages

    9

  • Pages from-to

  • UT code for WoS article

    000452462800002

  • EID of the result in the Scopus database

    2-s2.0-85059889718