A comparative study of the TID radiation effects on ASICs manufactured in 180 nm commercial technologies
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21340%2F18%3A00327024" target="_blank" >RIV/68407700:21340/18:00327024 - isvavai.cz</a>
Alternative codes found
RIV/68378271:_____/18:00519329
Result on the web
<a href="http://iopscience.iop.org/article/10.1088/1748-0221/13/12/C12003/meta" target="_blank" >http://iopscience.iop.org/article/10.1088/1748-0221/13/12/C12003/meta</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1088/1748-0221/13/12/C12003" target="_blank" >10.1088/1748-0221/13/12/C12003</a>
Alternative languages
Result language
angličtina
Original language name
A comparative study of the TID radiation effects on ASICs manufactured in 180 nm commercial technologies
Original language description
The presented study compares the effects of ionizing radiation on circuit structures manufactured in a 180 nm bulk CMOS and 180 nm SoI MOS technology. Ahigh-flux Co-60 medical radiation source with a dose rate of 460 Gy.min(-1) was used. The specimens under irradiation were placed in a Pb/Al enclosure providing an approximate electron equilibrium. Besides the analog and digital circuits, the ASICs also contain transistor test structures for direct study of irradiation effects upon electronics. The integral characteristics of current consumption, shifts in transistor threshold voltage and leakage current increase observations have been made. The SoI technology was shown to be several orders of magnitude more sensitive to TID effects, but during irradiation, its properties had a tendency to return to normal.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10301 - Atomic, molecular and chemical physics (physics of atoms and molecules including collision, interaction with radiation, magnetic resonances, Mössbauer effect)
Result continuities
Project
<a href="/en/project/TE01020069" target="_blank" >TE01020069: Advanced Detection Systems of Ionizing Radiation</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2018
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Journal of Instrumentation
ISSN
1748-0221
e-ISSN
1748-0221
Volume of the periodical
13
Issue of the periodical within the volume
December
Country of publishing house
IT - ITALY
Number of pages
9
Pages from-to
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UT code for WoS article
000452462800002
EID of the result in the Scopus database
2-s2.0-85059889718