All

What are you looking for?

All
Projects
Results
Organizations

Quick search

  • Projects supported by TA ČR
  • Excellent projects
  • Projects with the highest public support
  • Current projects

Smart search

  • That is how I find a specific +word
  • That is how I leave the -word out of the results
  • “That is how I can find the whole phrase”

Blister formation in He-H co-implanted InP: A comprehensive atomistic study

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21340%2F21%3A00350034" target="_blank" >RIV/68407700:21340/21:00350034 - isvavai.cz</a>

  • Alternative codes found

    RIV/68407700:21230/21:00350034 RIV/00216208:11320/21:10437265

  • Result on the web

    <a href="https://doi.org/10.1016/j.apsusc.2021.149426" target="_blank" >https://doi.org/10.1016/j.apsusc.2021.149426</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1016/j.apsusc.2021.149426" target="_blank" >10.1016/j.apsusc.2021.149426</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Blister formation in He-H co-implanted InP: A comprehensive atomistic study

  • Original language description

    The blistering efficiency in He-H-ions co-implanted and annealed InP has been found to peak and vanish in a narrow range of ion fluence ratio (?H/?He = 1.5?3.5) with a fixed He fluence of 2 ? 1016 He+/cm2. The blisters are formed at low fluence (?H/?He = 1.5), peaked in the middle (?H/?He = 2.5), and disappeared at the high fluence ratio (?H/?He = 3.5). To get a fundamental understanding of blister formation in nanoscale, the defect profiles were studied by various experimental techniques combined with FEM and ab-initio simulations. Crosssection TEM images showed that at a low fluence ratio, He and H are stored in microcracks and bubbles whereas, at a high fluence ratio, the ions are trapped only inside bubbles. These atomic processes that occur during and after co-implantation and annealing are presented together with detailed scenarios in an attempt to explain our results. Based on DFT simulations, the de-trapping of He atoms from the small clusters is energetically cheaper compared to the migration of He from the large clusters formed at high fluence. Moreover, at a high fluence ratio, the presence of large clusters inhibits the He diffusion to the small clusters (precursor of blisters) by capturing migrating He atoms.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    20501 - Materials engineering

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2021

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Applied Surface Science

  • ISSN

    0169-4332

  • e-ISSN

    1873-5584

  • Volume of the periodical

    552

  • Issue of the periodical within the volume

    June

  • Country of publishing house

    NL - THE KINGDOM OF THE NETHERLANDS

  • Number of pages

    13

  • Pages from-to

  • UT code for WoS article

    000639699800004

  • EID of the result in the Scopus database

    2-s2.0-85102283456