Characterization of LiNbO3 thin films using infrared and Raman spectroscopy

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21460%2F12%3A00193290" target="_blank" >RIV/68407700:21460/12:00193290 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Characterization of LiNbO3 thin films using infrared and Raman spectroscopy
Original language description
Lithium niobate (LiNbO3) is a material widely used in many technical applications. Films were studied for the development of doped planar waveguides. The films were deposited by Pulsed Laser Deposition method on SiO2/Si and (0001) sapphire substrates attemperatures 650°C, 700°C, 750°C, from one crystalline and two sintered LiNbO3 targets using KrF excimer laser. The crystalline phase of all prepared samples was verified by X-ray Diffraction method. Fourier Transform Infrared Spectroscopy and micro Raman Spectroscopy were used to characterize the dependence of the deposited films properties on the deposition conditions. These methods characterize the materials by monitoring their phonons whose spectra are sensitive to the film deposition parameters. Heat exposure leads to an increase in crystalline content, which can be determined by polarized spectra. Bulk LiNbO3 has rhombohedral crystal structure R3c (C3v6) with two chemical units per primitive cell, it means, that 30 degrees of free
Czech name
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Czech description
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Publication year
2012
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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