Bioimaging Using Full Field and Contact EUV and SXR Microscopes with Nanometer Spatial Resolution

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21460%2F17%3A00313263" target="_blank" >RIV/68407700:21460/17:00313263 - isvavai.cz</a>

Result on the web

<a href="http://dx.doi.org/10.3390/app7060548" target="_blank" >http://dx.doi.org/10.3390/app7060548</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.3390/app7060548" target="_blank" >10.3390/app7060548</a>

Result language

angličtina

Original language name

Bioimaging Using Full Field and Contact EUV and SXR Microscopes with Nanometer Spatial Resolution

Original language description

We present our recent results, related to nanoscale imaging in the extreme ultraviolet (EUV) and soft X-ray (SXR) spectral ranges and demonstrate three novel imaging systems recently developed for the purpose of obtaining high spatial resolution images of nanoscale objects with the EUV and SXR radiations. All the systems are based on laser-plasma EUV and SXR sources, employing a double stream gas puff target. The EUV and SXR full field microscopes-operating at 13.8 nm and 2.88 nm wavelengths, respectively-are currently capable of imaging nanostructures with a sub-50 nm spatial resolution with relatively short (seconds) exposure times. The third system is a SXR contact microscope, operating in the "water-window" spectral range (2.3-4.4 nm wavelength), to produce an imprint of the internal structure of the investigated object in a thin surface layer of SXR light sensitive poly(methyl methacrylate) photoresist. The development of such compact imaging systems is essential to the new research related to biological science, material science, and nanotechnology applications in the near future. Applications of all the microscopes for studies of biological samples including carcinoma cells, diatoms, and neurons are presented. Details about the sources, the microscopes, as well as the imaging results for various objects will be shown and discussed.

Czech name

—

Czech description

—

Type

J_imp - Article in a specialist periodical, which is included in the Web of Science database

CEP classification

—

OECD FORD branch

10305 - Fluids and plasma physics (including surface physics)

Project

—

Continuities

S - Specificky vyzkum na vysokych skolach

Publication year

2017

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Applied Sciences

ISSN

2076-3417

e-ISSN

2076-3417

Volume of the periodical

7

Issue of the periodical within the volume

6

Country of publishing house

CH - SWITZERLAND

Number of pages

13

Pages from-to

—

UT code for WoS article

000404449800024

EID of the result in the Scopus database

2-s2.0-85020043260