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Performance of bulk semi-insulating GaAs-based sensor and its comparison to Si-based sensor for Timepix radiation camera

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21460%2F19%3A00329975" target="_blank" >RIV/68407700:21460/19:00329975 - isvavai.cz</a>

  • Alternative codes found

    RIV/68407700:21670/19:00329975

  • Result on the web

    <a href="https://doi.org/10.1088/1748-0221/14/01/C01023" target="_blank" >https://doi.org/10.1088/1748-0221/14/01/C01023</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1088/1748-0221/14/01/C01023" target="_blank" >10.1088/1748-0221/14/01/C01023</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Performance of bulk semi-insulating GaAs-based sensor and its comparison to Si-based sensor for Timepix radiation camera

  • Original language description

    Nowadays, pixelated detectors based on Timepix readout chip play important role in various fields of science and research like particle physics, advanced spectrometry and especially X-ray imaging for medical and material purposes. Present work is focused on the evaluation of the 350 mu m thick prototype (semi-insulating) SI GaAs sensor performance and its comparison to 300 mu m thick Si sensor that was chosen as a reference. Both sensors consist of 256 x 256 pixels matrix with pixel pitch of 55 mu m. We performed flat field illumination to test the pixel homogeneity and found out that the response of GaAs sensor is less homogeneous in terms of number of counts across the sensor compared to Si sensor. The imaging performance was tested using two samples of different absorption strength, specifically one less-absorbing sample and one more-absorbing sample. We found out that our fabricated SI GaAs sensor shows better imaging performance than Si sensor in case of imaging more-absorbing sample and vice versa. This is due to different prevalent detection efficiency regions. The spatial resolution was determined to be 8.73 lp/mm and 8.25 lp/mm for GaAs and Si sensor, respectively. Also, spectrometric measurements were carried out and results show that Si sensor has about 2 times higher energy resolution in comparison with SI GaAs sensor.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    10303 - Particles and field physics

Result continuities

  • Project

  • Continuities

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2019

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Journal of Instrumentation

  • ISSN

    1748-0221

  • e-ISSN

    1748-0221

  • Volume of the periodical

    14

  • Issue of the periodical within the volume

    C01023

  • Country of publishing house

    GB - UNITED KINGDOM

  • Number of pages

    10

  • Pages from-to

  • UT code for WoS article

    000456944800002

  • EID of the result in the Scopus database

    2-s2.0-85062515171