Scanning Probe Microscopy Used for 3D Topography Image Acquisition of Marks on Cartidge Cases in Forensic Ballistics
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F70883521%3A28140%2F16%3A43875048" target="_blank" >RIV/70883521:28140/16:43875048 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Scanning Probe Microscopy Used for 3D Topography Image Acquisition of Marks on Cartidge Cases in Forensic Ballistics
Original language description
In spite of the significance of tool mark analysis in forensic ballistics, the image acquisition and comparison of tool marks remains a difficult and time consuming effort. This work deals with modified scanning probe microscopy applied to examination of marks on the surface of fired cartridge cases. Marks after firing pin are represented by 3-D topography image from measured data and compared according to images taken from confocal microscope and scanning electron microscope.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JB - Sensors, detecting elements, measurement and regulation
OECD FORD branch
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Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2016
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Tenth International Conference on Emerging Security Information, Systems and Technologies
ISBN
978-1-61208-493-0
ISSN
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e-ISSN
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Number of pages
6
Pages from-to
45-50
Publisher name
IARIA XPS Press
Place of publication
Wilmington
Event location
Nice
Event date
Jul 24, 2016
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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