Use of Electron Microscopy for Material Analysis in Forensic Practice

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00007064%3AK01__%2F14%3A%230000146" target="_blank" >RIV/00007064:K01__/14:#0000146 - isvavai.cz</a>

Výsledek na webu

<a href="http://www.microscopy.cz/abstracts/1766.pdf" target="_blank" >http://www.microscopy.cz/abstracts/1766.pdf</a>

DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Use of Electron Microscopy for Material Analysis in Forensic Practice

Popis výsledku v původním jazyce

In forensic practice, electron microscopy and microanalysis rank among basic applications used in forensic investigation of traces and comparisons from crime scenes. These techniques allow for rapid screening and receiving essential information for a wide range of traces. The set of materials that are analysed using electron microscopy is very extensive, practically any material produced by human and nature activities relating to the case that is solved can be delivered to a forensic lab (ranging from the fragment of an ancient vessel, to high-tech semiconductors). Therefore, materials of organic origin, plant and animal fragments are examined as well. Recently, dual systems with focused ion beam have considerably extended possibilities of electron microscopy. These systems are predominantly applied in the study of the inner structure of micro-and nanoparticles, layers and composites (intersecting lines in forensic graphical examinations, analyses of functional glass layers, etc.), the study of alloys microdefects, creating 3D models of particles and aggregates, etc. Automated mineralogical analyses are a great asset for the analysis of mineral phases, particularly soils, analogously as cathode luminescence. TOF-SIMS systems and micro-Raman spectroscopy with a resolution comparable to standard analysis EDS/WDS are latest crucial innovations that are becoming to appear also at ordinary laboratories.

Název v anglickém jazyce

Use of Electron Microscopy for Material Analysis in Forensic Practice

Popis výsledku anglicky

In forensic practice, electron microscopy and microanalysis rank among basic applications used in forensic investigation of traces and comparisons from crime scenes. These techniques allow for rapid screening and receiving essential information for a wide range of traces. The set of materials that are analysed using electron microscopy is very extensive, practically any material produced by human and nature activities relating to the case that is solved can be delivered to a forensic lab (ranging from the fragment of an ancient vessel, to high-tech semiconductors). Therefore, materials of organic origin, plant and animal fragments are examined as well. Recently, dual systems with focused ion beam have considerably extended possibilities of electron microscopy. These systems are predominantly applied in the study of the inner structure of micro-and nanoparticles, layers and composites (intersecting lines in forensic graphical examinations, analyses of functional glass layers, etc.), the study of alloys microdefects, creating 3D models of particles and aggregates, etc. Automated mineralogical analyses are a great asset for the analysis of mineral phases, particularly soils, analogously as cathode luminescence. TOF-SIMS systems and micro-Raman spectroscopy with a resolution comparable to standard analysis EDS/WDS are latest crucial innovations that are becoming to appear also at ordinary laboratories.

Druh

D - Stať ve sborníku

CEP obor

AG - Právní vědy

OECD FORD obor

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Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2014

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

18TH INTERNATIONAL MICROSCOPY CONGRESS

ISBN

978-80-260-6720-7

ISSN

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e-ISSN

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Počet stran výsledku

2

Strana od-do

4015-4016

Název nakladatele

Czechoslovak Microscopy Society

Místo vydání

Praha

Místo konání akce

Praha

Datum konání akce

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Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

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