Scanner configuration suitable for both Zener reference standards comparisons and JVS measurements

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00177016%3A_____%2F11%3A%230000364" target="_blank" >RIV/00177016:_____/11:#0000364 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Scanner configuration suitable for both Zener reference standards comparisons and JVS measurements

Popis výsledku v původním jazyce

In this paper configurations of national standards of DC voltage often used in National metrological institutes are discussed. The typical configurations of scanner used for comparing voltages of bank of Zener reference standards and for Josephson voltage systems are described. Both systems are often used in laboratories of national rnetrological institutes. This leads to duplication of nanovoltmeters in a laboratory or often change of connecting wires. New scanner configuration used for the connectionof the bank of Zener reference standards and Josephson voltage system together is presented. The advantage is the necessity of only one nanovoltmeter and the fixed configuration without the need of changing the wires for the current ongoing measurement.The drawback is that offsets of the scanner influence the Josephson voltage system measurements. This configuration was already tested in Czech Metrology Institute. Scanner offsets have been measured by means of two methods: by replacing

Název v anglickém jazyce

Scanner configuration suitable for both Zener reference standards comparisons and JVS measurements

Popis výsledku anglicky

In this paper configurations of national standards of DC voltage often used in National metrological institutes are discussed. The typical configurations of scanner used for comparing voltages of bank of Zener reference standards and for Josephson voltage systems are described. Both systems are often used in laboratories of national rnetrological institutes. This leads to duplication of nanovoltmeters in a laboratory or often change of connecting wires. New scanner configuration used for the connectionof the bank of Zener reference standards and Josephson voltage system together is presented. The advantage is the necessity of only one nanovoltmeter and the fixed configuration without the need of changing the wires for the current ongoing measurement.The drawback is that offsets of the scanner influence the Josephson voltage system measurements. This configuration was already tested in Czech Metrology Institute. Scanner offsets have been measured by means of two methods: by replacing

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

JB - Senzory, čidla, měření a regulace

OECD FORD obor

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Projekt

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Návaznosti

V - Vyzkumna aktivita podporovana z jinych verejnych zdroju

Rok uplatnění

2011

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Elektronika

ISSN

0033-2089

e-ISSN

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Svazek periodika

6

Číslo periodika v rámci svazku

2011

Stát vydavatele periodika

PL - Polská republika

Počet stran výsledku

3

Strana od-do

55-57

Kód UT WoS článku

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EID výsledku v databázi Scopus

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