Device for emissivity measurement

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00177016%3A_____%2F13%3A%230001001" target="_blank" >RIV/00177016:_____/13:#0001001 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Device for emissivity measurement

Popis výsledku v původním jazyce

Knowledge of the true material emissivity is crucial for the correct non-contact temperature measurement. Emissivity of the blackbodies can be easily calculated from the geometrical parameters and knowledge of the material. Determination of the materialemissivity, which is not directly part of the radiator is much more complicated, and cannot be determined only by calculations. Therefore, the device for the emissivity determination was designed and developed at CMIs Thermal properties department. Facility allows to determine the material emissivity in temperature range from 50 °C to 500 °C, in the future is planned extend this range up to 800 °C. Temperature of the sample with unknown emissivity is measured with thermocouple and radiation thermometer.Emissivity of this material is than calculated from these measured values. This paper will present the design of the facility, suitable for the determination of the sample emissivity, metrological characterisation of the device and the u

Název v anglickém jazyce

Device for emissivity measurement

Popis výsledku anglicky

Knowledge of the true material emissivity is crucial for the correct non-contact temperature measurement. Emissivity of the blackbodies can be easily calculated from the geometrical parameters and knowledge of the material. Determination of the materialemissivity, which is not directly part of the radiator is much more complicated, and cannot be determined only by calculations. Therefore, the device for the emissivity determination was designed and developed at CMIs Thermal properties department. Facility allows to determine the material emissivity in temperature range from 50 °C to 500 °C, in the future is planned extend this range up to 800 °C. Temperature of the sample with unknown emissivity is measured with thermocouple and radiation thermometer.Emissivity of this material is than calculated from these measured values. This paper will present the design of the facility, suitable for the determination of the sample emissivity, metrological characterisation of the device and the u

Druh

D - Stať ve sborníku

CEP obor

BJ - Termodynamika

OECD FORD obor

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Projekt

<a href="/cs/project/7AX12096" target="_blank" >7AX12096: Metrologie pro vysoké teploty v průmyslových aplikacích (>1000 °C)</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2013

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

Symposium on temperature and thermal measurements in industry and science

ISBN

978-972-8574-15-4

ISSN

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e-ISSN

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Počet stran výsledku

1

Strana od-do

162

Název nakladatele

Madeira

Místo vydání

Madeira

Místo konání akce

Madeira

Datum konání akce

1. 1. 2013

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

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