Interlaboratory Comparison of Dielectric Measurements From Microwave to Terahertz Frequencies Using VNA-Based and Optical-Based Methods

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00177016%3A_____%2F24%3AN0000069" target="_blank" >RIV/00177016:_____/24:N0000069 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/00177016:_____/24:N0000088

Výsledek na webu

<a href="https://zenodo.org/records/14959579" target="_blank" >https://zenodo.org/records/14959579</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1109/TMTT.2024.3399879" target="_blank" >10.1109/TMTT.2024.3399879</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Interlaboratory Comparison of Dielectric Measurements From Microwave to Terahertz Frequencies Using VNA-Based and Optical-Based Methods

Popis výsledku v původním jazyce

This article reports on an extensive interlaboratory comparison of measurements of material properties between 2 GHz and 1 THz using both vector network analyzer (VNA)-based and optical-based methods. For the former, techniques including open resonators, conventional free-space quasioptical systems, and a relatively new guided free-space approach through use of material characterization kits (MCKs) were utilized. The optical-based methods included both time-domain spectroscopy (TDS) and frequency-domain spectroscopy (FDS). Measurement setups for these five techniques located at five well-established laboratories have been employed in the measurements of seven types of commonly used dielectric materials. The results of the measurements by the participating laboratories using each of these techniques were compared to assess levels of agreement between the utilized techniques and thereby establish confidence in the characterizations of each material. Measurement results of these seven materials are presented, together with detailed discussion. This is the first time that an interlaboratory measurement comparison of material properties has been conducted over nearly three decades of frequency and involving such a range of techniques. This work should prove beneficial to applications where material properties need to be known accurately in the microwave to terahertz region.

Název v anglickém jazyce

Interlaboratory Comparison of Dielectric Measurements From Microwave to Terahertz Frequencies Using VNA-Based and Optical-Based Methods

Popis výsledku anglicky

This article reports on an extensive interlaboratory comparison of measurements of material properties between 2 GHz and 1 THz using both vector network analyzer (VNA)-based and optical-based methods. For the former, techniques including open resonators, conventional free-space quasioptical systems, and a relatively new guided free-space approach through use of material characterization kits (MCKs) were utilized. The optical-based methods included both time-domain spectroscopy (TDS) and frequency-domain spectroscopy (FDS). Measurement setups for these five techniques located at five well-established laboratories have been employed in the measurements of seven types of commonly used dielectric materials. The results of the measurements by the participating laboratories using each of these techniques were compared to assess levels of agreement between the utilized techniques and thereby establish confidence in the characterizations of each material. Measurement results of these seven materials are presented, together with detailed discussion. This is the first time that an interlaboratory measurement comparison of material properties has been conducted over nearly three decades of frequency and involving such a range of techniques. This work should prove beneficial to applications where material properties need to be known accurately in the microwave to terahertz region.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

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OECD FORD obor

20201 - Electrical and electronic engineering

Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2024

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

IEEE Transactions on Microwave Theory and Techniques

ISSN

0018-9480

e-ISSN

1557-9670

Svazek periodika

72

Číslo periodika v rámci svazku

11

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

12

Strana od-do

6473-6484

Kód UT WoS článku

001230791900001

EID výsledku v databázi Scopus

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