Virtual subpixel approach for single-mask phase-contrast imaging using Timepix3

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11110%2F19%3A10396075" target="_blank" >RIV/00216208:11110/19:10396075 - isvavai.cz</a>

Výsledek na webu

<a href="https://verso.is.cuni.cz/pub/verso.fpl?fname=obd_publikace_handle&handle=E5vN12H-fo" target="_blank" >https://verso.is.cuni.cz/pub/verso.fpl?fname=obd_publikace_handle&handle=E5vN12H-fo</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1088/1748-0221/14/01/C01011" target="_blank" >10.1088/1748-0221/14/01/C01011</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Virtual subpixel approach for single-mask phase-contrast imaging using Timepix3

Popis výsledku v původním jazyce

X-ray phase contrast imaging provides a method to distinguish materials with similar density and effective atomic number, which otherwise would be difficult using conventional X-ray absorption contrast. In recent years, multiple methods have been developed to acquire X-ray phase contrast images using incoherent laboratory sources. The single mask edge illumination setup has been demonstrated as a possible candidate for large scale applications due to its relaxed restrictions on longitudinal coherence and mask alignment, and for its ability to do bi-directional phase contrast images in a single sample exposure. Unfortunately, the single mask edge illumination setup&apos;s refraction sensitivity, and thereby signal to noise, is limited by detector artifacts. Furthermore, it requires multiple exposures to perform dark-field imaging, a method that enables imaging of micro-structures smaller than the image resolution. We propose using an Advapix detector with Timepix3 pixel-readout chip in a single mask imaging setup to improve signal to noise ratio in phase contrast images. This is achieved using the Timepix3 chip&apos;s ability to simultaneously acquire fast time of arrival and time over threshold measurement of single photon events, which enables sub-pixel identification of individual photons. In this paper, we demonstrate that signal to noise ratio can be improved by at least 67 +/- 5 % using sub-pixel identification of single photons compared to conventional acquisitions methods. Thereby the required sample dose can be reduced considerably. This shows that there is a great potential in using Timepix3 chip to improve x-ray phase contrast imaging. Further, the results indicate the possibility for dark field imaging in a single sample exposure using Timepix3 in a single mask edge illumination setup.

Název v anglickém jazyce

Virtual subpixel approach for single-mask phase-contrast imaging using Timepix3

Popis výsledku anglicky

X-ray phase contrast imaging provides a method to distinguish materials with similar density and effective atomic number, which otherwise would be difficult using conventional X-ray absorption contrast. In recent years, multiple methods have been developed to acquire X-ray phase contrast images using incoherent laboratory sources. The single mask edge illumination setup has been demonstrated as a possible candidate for large scale applications due to its relaxed restrictions on longitudinal coherence and mask alignment, and for its ability to do bi-directional phase contrast images in a single sample exposure. Unfortunately, the single mask edge illumination setup&apos;s refraction sensitivity, and thereby signal to noise, is limited by detector artifacts. Furthermore, it requires multiple exposures to perform dark-field imaging, a method that enables imaging of micro-structures smaller than the image resolution. We propose using an Advapix detector with Timepix3 pixel-readout chip in a single mask imaging setup to improve signal to noise ratio in phase contrast images. This is achieved using the Timepix3 chip&apos;s ability to simultaneously acquire fast time of arrival and time over threshold measurement of single photon events, which enables sub-pixel identification of individual photons. In this paper, we demonstrate that signal to noise ratio can be improved by at least 67 +/- 5 % using sub-pixel identification of single photons compared to conventional acquisitions methods. Thereby the required sample dose can be reduced considerably. This shows that there is a great potential in using Timepix3 chip to improve x-ray phase contrast imaging. Further, the results indicate the possibility for dark field imaging in a single sample exposure using Timepix3 in a single mask edge illumination setup.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

30224 - Radiology, nuclear medicine and medical imaging

Projekt

—

Návaznosti

V - Vyzkumna aktivita podporovana z jinych verejnych zdroju

Rok uplatnění

2019

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Journal of Instrumentation

ISSN

1748-0221

e-ISSN

—

Svazek periodika

14

Číslo periodika v rámci svazku

January

Stát vydavatele periodika

GB - Spojené království Velké Británie a Severního Irska

Počet stran výsledku

11

Strana od-do

C01011

Kód UT WoS článku

000455434700002

EID výsledku v databázi Scopus

2-s2.0-85062563470