Interference phenomena in nanocrystalline materials and their application in the microstructure analysis

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F08%3A00206884" target="_blank" >RIV/00216208:11320/08:00206884 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Interference phenomena in nanocrystalline materials and their application in the microstructure analysis

Popis výsledku v původním jazyce

Microstructural analytical methods with a high spatial resolution are needed for microstructure studies on nanocrystalline materials and nanocomposites in order to be able to explain the relationship between the microstructure and properties on the nanoscale. Theoretical considerations and experimental results presented in this contribution illustrate the capabilities of the X-ray diffraction that takes into account the phenomenon of the partial coherence of nanocrystallites for the microstructure analysis of nanostructured materials. The results obtained from X-ray diffraction were verified and complemented by the transmission electron microscopy with high resolution. Particularly, the use of the transmission electron microscopy in order to check thereliability of this X-ray diffraction approach is discussed. As experimental examples, nanocrystalline (Cr, Al) N coatings and boron nitride nanocomposites are presented in this contribution.

Název v anglickém jazyce

Interference phenomena in nanocrystalline materials and their application in the microstructure analysis

Popis výsledku anglicky

Microstructural analytical methods with a high spatial resolution are needed for microstructure studies on nanocrystalline materials and nanocomposites in order to be able to explain the relationship between the microstructure and properties on the nanoscale. Theoretical considerations and experimental results presented in this contribution illustrate the capabilities of the X-ray diffraction that takes into account the phenomenon of the partial coherence of nanocrystallites for the microstructure analysis of nanostructured materials. The results obtained from X-ray diffraction were verified and complemented by the transmission electron microscopy with high resolution. Particularly, the use of the transmission electron microscopy in order to check thereliability of this X-ray diffraction approach is discussed. As experimental examples, nanocrystalline (Cr, Al) N coatings and boron nitride nanocomposites are presented in this contribution.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BM - Fyzika pevných látek a magnetismus

OECD FORD obor

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Projekt

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Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2008

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Zeitschrift für Kristallographie

ISSN

0044-2968

e-ISSN

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Svazek periodika

27

Číslo periodika v rámci svazku

27

Stát vydavatele periodika

DE - Spolková republika Německo

Počet stran výsledku

12

Strana od-do

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Kód UT WoS článku

000264441800003

EID výsledku v databázi Scopus

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