Modelling effects of small crystallite size and lattice defects on powder diffraction lines

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F12%3A10130401" target="_blank" >RIV/00216208:11320/12:10130401 - isvavai.cz</a>

Výsledek na webu

<a href="http://xray.cz/ms/bul2012-2/sessione.pdf" target="_blank" >http://xray.cz/ms/bul2012-2/sessione.pdf</a>

DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Modelling effects of small crystallite size and lattice defects on powder diffraction lines

Popis výsledku v původním jazyce

X-ray powder diffraction (XRPD) tech niques are very appropriate for characterisation of various materials as non-destructive and containing rich information on phase composition, lattice parameters, crystal structure and other aspects of material structure on nanometre and submicrometer scale, which can be re lated to application properties and hence to be also of technological interest. Presence of lattice defects, their type and concen tration as well as crystal lite size can be determined from widthand shape of diffraction lines. The aim of this contribution is to give a short over view of classical approaches of a line profile analysis (LPA) complemented with methods based on simulations and fit ting of whole diffraction patterns ad vanced duringthe last decade. The theoretical summary is supplemented with some practical examples.

Název v anglickém jazyce

Modelling effects of small crystallite size and lattice defects on powder diffraction lines

Popis výsledku anglicky

X-ray powder diffraction (XRPD) tech niques are very appropriate for characterisation of various materials as non-destructive and containing rich information on phase composition, lattice parameters, crystal structure and other aspects of material structure on nanometre and submicrometer scale, which can be re lated to application properties and hence to be also of technological interest. Presence of lattice defects, their type and concen tration as well as crystal lite size can be determined from widthand shape of diffraction lines. The aim of this contribution is to give a short over view of classical approaches of a line profile analysis (LPA) complemented with methods based on simulations and fit ting of whole diffraction patterns ad vanced duringthe last decade. The theoretical summary is supplemented with some practical examples.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BM - Fyzika pevných látek a magnetismus

OECD FORD obor

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Projekt

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Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2012

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Materials Structure in Chemistry, Biology Physics and Technology

ISSN

1211-5894

e-ISSN

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Svazek periodika

19

Číslo periodika v rámci svazku

2

Stát vydavatele periodika

CZ - Česká republika

Počet stran výsledku

3

Strana od-do

121-123

Kód UT WoS článku

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EID výsledku v databázi Scopus

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