Oriented Y-type hexagonal ferrite thin films prepared by chemical solution deposition

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F13%3A10145603" target="_blank" >RIV/00216208:11320/13:10145603 - isvavai.cz</a>

Výsledek na webu

<a href="http://dx.doi.org/10.1016/j.jssc.2013.04.026" target="_blank" >http://dx.doi.org/10.1016/j.jssc.2013.04.026</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.jssc.2013.04.026" target="_blank" >10.1016/j.jssc.2013.04.026</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Oriented Y-type hexagonal ferrite thin films prepared by chemical solution deposition

Popis výsledku v původním jazyce

Thin films of Ba2Zn2Fe12O22 (Y) hexaferrite were prepared through the chemical solution deposition method on SrTiO3(1 1 1) (ST) single crystal substrates using epitaxial SrFe12O19 (M) hexaferrite thin layer as a seed template layer. The process of crystallization was mainly investigated by means of X-ray diffraction and atomic force microscopy. A detailed inspection revealed that growth of seed layer starts through the break-up of initially continuous film into isolated grains with expressive shape anisotropy and hexagonal habit. The vital parameters of the seed layer, i.e. thickness, substrate coverage, crystallization conditions and temperature ramp were optimized with the aim to obtain epitaxially crystallized Y phase. X-ray diffraction Pole figuremeasurements and Phi scans reveal perfect parallel in-plane alignment of SrTiO3 substrate and both hexaferrite phases. (C) 2013 Elsevier Inc. All rights reserved.

Název v anglickém jazyce

Oriented Y-type hexagonal ferrite thin films prepared by chemical solution deposition

Popis výsledku anglicky

Thin films of Ba2Zn2Fe12O22 (Y) hexaferrite were prepared through the chemical solution deposition method on SrTiO3(1 1 1) (ST) single crystal substrates using epitaxial SrFe12O19 (M) hexaferrite thin layer as a seed template layer. The process of crystallization was mainly investigated by means of X-ray diffraction and atomic force microscopy. A detailed inspection revealed that growth of seed layer starts through the break-up of initially continuous film into isolated grains with expressive shape anisotropy and hexagonal habit. The vital parameters of the seed layer, i.e. thickness, substrate coverage, crystallization conditions and temperature ramp were optimized with the aim to obtain epitaxially crystallized Y phase. X-ray diffraction Pole figuremeasurements and Phi scans reveal perfect parallel in-plane alignment of SrTiO3 substrate and both hexaferrite phases. (C) 2013 Elsevier Inc. All rights reserved.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BM - Fyzika pevných látek a magnetismus

OECD FORD obor

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Projekt

—

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2013

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Journal of Solid State Chemistry

ISSN

0022-4596

e-ISSN

—

Svazek periodika

203

Číslo periodika v rámci svazku

July

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

6

Strana od-do

100-105

Kód UT WoS článku

000325190300016

EID výsledku v databázi Scopus

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