Dynamic scaling and kinetic roughening of poly(ethylene) islands grown by vapor phase deposition

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F14%3A10282220" target="_blank" >RIV/00216208:11320/14:10282220 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/61389013:_____/14:00431010

Výsledek na webu

<a href="http://dx.doi.org/10.1016/j.tsf.2014.06.029" target="_blank" >http://dx.doi.org/10.1016/j.tsf.2014.06.029</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.tsf.2014.06.029" target="_blank" >10.1016/j.tsf.2014.06.029</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Dynamic scaling and kinetic roughening of poly(ethylene) islands grown by vapor phase deposition

Popis výsledku v původním jazyce

Vapor phase deposition of poly(ethylene) is shown to produce uncross-linked thin films consisting of linear CH2 (100) oligomers with narrow molar mass distribution of dispersity D-M - 1.10. Early stages of the film formation are characterized by the growth of two-dimensional compact islands of constant 7-8 nm thickness. The transversal evolution of islands is studied in the context of the Dynamic Scaling Theory. The aggregation regime is found to be valid in a narrow range of coverage 0.1 < theta < 0.3.The critical island size is estimated to be i = 1. Kinetic roughening of the growing front gives a set of the scaling exponents alpha(loc) = 0.67, alpha(s) = 0.85, beta = 0.33 (beta = 0.2 for the late stages of growth) and z = 2.2 that does not fit intoany of the known universality classes. Macromolecular relaxation at the island edges is suggested to explain the observed inconsistence.

Název v anglickém jazyce

Dynamic scaling and kinetic roughening of poly(ethylene) islands grown by vapor phase deposition

Popis výsledku anglicky

Vapor phase deposition of poly(ethylene) is shown to produce uncross-linked thin films consisting of linear CH2 (100) oligomers with narrow molar mass distribution of dispersity D-M - 1.10. Early stages of the film formation are characterized by the growth of two-dimensional compact islands of constant 7-8 nm thickness. The transversal evolution of islands is studied in the context of the Dynamic Scaling Theory. The aggregation regime is found to be valid in a narrow range of coverage 0.1 < theta < 0.3.The critical island size is estimated to be i = 1. Kinetic roughening of the growing front gives a set of the scaling exponents alpha(loc) = 0.67, alpha(s) = 0.85, beta = 0.33 (beta = 0.2 for the late stages of growth) and z = 2.2 that does not fit intoany of the known universality classes. Macromolecular relaxation at the island edges is suggested to explain the observed inconsistence.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BM - Fyzika pevných látek a magnetismus

OECD FORD obor

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Projekt

—

Návaznosti

S - Specificky vyzkum na vysokych skolach

Rok uplatnění

2014

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Thin Solid Films

ISSN

0040-6090

e-ISSN

—

Svazek periodika

565

Číslo periodika v rámci svazku

August

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

12

Strana od-do

249-260

Kód UT WoS článku

000341054600038

EID výsledku v databázi Scopus

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