Characterization of lattice defects in metallic materials by positron annihilation spectroscopy: A review
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F18%3A10388173" target="_blank" >RIV/00216208:11320/18:10388173 - isvavai.cz</a>
Výsledek na webu
<a href="https://doi.org/10.1016/j.jmst.2017.11.050" target="_blank" >https://doi.org/10.1016/j.jmst.2017.11.050</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.jmst.2017.11.050" target="_blank" >10.1016/j.jmst.2017.11.050</a>
Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
Characterization of lattice defects in metallic materials by positron annihilation spectroscopy: A review
Popis výsledku v původním jazyce
Positron is an excellent probe of lattice defects in solids. A thermallized positron delocalized in lattice can be trapped at open volume defects, e.g. vacancies, dislocations, grain boundaries etc. Positron annihilation spectroscopy is a non-destructive technique which enables characterization of open volume lattice defects in solids on the atomic scale. Positron lifetime and Doppler broadening of annihilation photo-peak are the most common observables related to positron annihilation process. Positron lifetime spectroscopy enables to identify defects in solids and to determine their concentrations while coincidence measurement of Doppler broadening provides information about local chemical environment of defects. This article provides a review of the state-of-art of defect characterization in bulk metallic materials by positron annihilation spectroscopy. Advanced analysis of positron annihilation data and recent developments of positron annihilation methodology are described and discussed on examples of defect studies of metallic materials. Future development in the field is proposed as well.
Název v anglickém jazyce
Characterization of lattice defects in metallic materials by positron annihilation spectroscopy: A review
Popis výsledku anglicky
Positron is an excellent probe of lattice defects in solids. A thermallized positron delocalized in lattice can be trapped at open volume defects, e.g. vacancies, dislocations, grain boundaries etc. Positron annihilation spectroscopy is a non-destructive technique which enables characterization of open volume lattice defects in solids on the atomic scale. Positron lifetime and Doppler broadening of annihilation photo-peak are the most common observables related to positron annihilation process. Positron lifetime spectroscopy enables to identify defects in solids and to determine their concentrations while coincidence measurement of Doppler broadening provides information about local chemical environment of defects. This article provides a review of the state-of-art of defect characterization in bulk metallic materials by positron annihilation spectroscopy. Advanced analysis of positron annihilation data and recent developments of positron annihilation methodology are described and discussed on examples of defect studies of metallic materials. Future development in the field is proposed as well.
Klasifikace
Druh
J<sub>imp</sub> - Článek v periodiku v databázi Web of Science
CEP obor
—
OECD FORD obor
10302 - Condensed matter physics (including formerly solid state physics, supercond.)
Návaznosti výsledku
Projekt
<a href="/cs/project/GA16-12828S" target="_blank" >GA16-12828S: Vliv defektů na raná stadia precipitace v lehkých vytvrditelných slitinách</a><br>
Návaznosti
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Ostatní
Rok uplatnění
2018
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Údaje specifické pro druh výsledku
Název periodika
Journal of Materials Science and Technology
ISSN
1005-0302
e-ISSN
—
Svazek periodika
34
Číslo periodika v rámci svazku
4
Stát vydavatele periodika
CN - Čínská lidová republika
Počet stran výsledku
22
Strana od-do
577-598
Kód UT WoS článku
000428188900001
EID výsledku v databázi Scopus
2-s2.0-85037595047