Annealing induced effect on the physical properties of ion-beam sputtered 0.5 Ba(Zr0.2Ti0.8)O-3-0.5 (Ba0.7Ca0.3)TiO3-delta ferroelectric thin films

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F18%3A10389409" target="_blank" >RIV/00216208:11320/18:10389409 - isvavai.cz</a>

Výsledek na webu

<a href="https://doi.org/10.1016/j.apsusc.2018.02.269" target="_blank" >https://doi.org/10.1016/j.apsusc.2018.02.269</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.apsusc.2018.02.269" target="_blank" >10.1016/j.apsusc.2018.02.269</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Annealing induced effect on the physical properties of ion-beam sputtered 0.5 Ba(Zr0.2Ti0.8)O-3-0.5 (Ba0.7Ca0.3)TiO3-delta ferroelectric thin films

Popis výsledku v původním jazyce

This work reports thermal annealing induced effect on the structural, optical, chemical and ferroelectric properties of ion-beam sputtered lead-free ferroelectric 0.5 Ba(Zr0.2Ti0.8)O-3 - 0.5(Ba0.7Ca0.3)TiO3-delta (0.5BZT-0.5BCT) thin films. X-ray diffraction studies reveal that the tetragonality increases with the annealing temperature (T-a), while photoluminescence and X-ray photoelectron spectroscopy studies confirm that this effect is associated with the annihilation of the oxygen vacancies as well as changes in the Ba2+ coordination. The films annealed at 750 degrees C show a remarkable remnant polarization of P-r = 45.0 mu C/cm(2), with a coercive field of 32 kV/cm. The temperature dependence of the spontaneous polarization of the 0.5BZT-0.5BCT film reveals a mean field behavior of the polarization and the fatigue study reveals that P-r only decreases 3% after passing 10(9) cycles. Therefore the high remnant polarization and its high P-r stability make these films as promising candidates for memory applications.

Název v anglickém jazyce

Annealing induced effect on the physical properties of ion-beam sputtered 0.5 Ba(Zr0.2Ti0.8)O-3-0.5 (Ba0.7Ca0.3)TiO3-delta ferroelectric thin films

Popis výsledku anglicky

This work reports thermal annealing induced effect on the structural, optical, chemical and ferroelectric properties of ion-beam sputtered lead-free ferroelectric 0.5 Ba(Zr0.2Ti0.8)O-3 - 0.5(Ba0.7Ca0.3)TiO3-delta (0.5BZT-0.5BCT) thin films. X-ray diffraction studies reveal that the tetragonality increases with the annealing temperature (T-a), while photoluminescence and X-ray photoelectron spectroscopy studies confirm that this effect is associated with the annihilation of the oxygen vacancies as well as changes in the Ba2+ coordination. The films annealed at 750 degrees C show a remarkable remnant polarization of P-r = 45.0 mu C/cm(2), with a coercive field of 32 kV/cm. The temperature dependence of the spontaneous polarization of the 0.5BZT-0.5BCT film reveals a mean field behavior of the polarization and the fatigue study reveals that P-r only decreases 3% after passing 10(9) cycles. Therefore the high remnant polarization and its high P-r stability make these films as promising candidates for memory applications.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10305 - Fluids and plasma physics (including surface physics)

Projekt

<a href="/cs/project/LM2015057" target="_blank" >LM2015057: Laboratoř fyziky povrchů – Optická dráha pro výzkum materiálů</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2018

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Applied Surface Science

ISSN

0169-4332

e-ISSN

—

Svazek periodika

443

Číslo periodika v rámci svazku

Jun

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

7

Strana od-do

354-360

Kód UT WoS článku

000428446300042

EID výsledku v databázi Scopus

2-s2.0-85043300185