Oxidation and erosion of single crystal CdTe surface in distilled water and NaCl solution

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F19%3A10399553" target="_blank" >RIV/00216208:11320/19:10399553 - isvavai.cz</a>

Výsledek na webu

<a href="https://verso.is.cuni.cz/pub/verso.fpl?fname=obd_publikace_handle&handle=.zJfV7FJRb" target="_blank" >https://verso.is.cuni.cz/pub/verso.fpl?fname=obd_publikace_handle&handle=.zJfV7FJRb</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.tsf.2019.137426" target="_blank" >10.1016/j.tsf.2019.137426</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Oxidation and erosion of single crystal CdTe surface in distilled water and NaCl solution

Popis výsledku v původním jazyce

Surface oxide formation was examined on low resistivity p-type CdTe single crystals immersed into distilled water held at 50 degrees C. The oxide thickness and roughness were investigated by spectroscopic ellipsometry, and its composition was studied by X-ray photoelectron spectroscopy. It was observed that after the fast growth of thin oxide layer with the thickness 1.7 nm the growth of oxide layer is proportional to a square root of the immersion time. The oxidation was described by a model in which the oxidation rate is limited by the drift of positive Cd ions from the CdTe-oxide interface into water. The penetration of Na and erosion of CdTe immersed in saturated NaCl solution was investigated by secondary ion mass spectrometry measurements on samples treated in NaCl solution for different time intervals. Very low determined diffusion coefficient of Na was explained by trapping of Na on acceptor-type defects in Cd sublattice.

Název v anglickém jazyce

Oxidation and erosion of single crystal CdTe surface in distilled water and NaCl solution

Popis výsledku anglicky

Surface oxide formation was examined on low resistivity p-type CdTe single crystals immersed into distilled water held at 50 degrees C. The oxide thickness and roughness were investigated by spectroscopic ellipsometry, and its composition was studied by X-ray photoelectron spectroscopy. It was observed that after the fast growth of thin oxide layer with the thickness 1.7 nm the growth of oxide layer is proportional to a square root of the immersion time. The oxidation was described by a model in which the oxidation rate is limited by the drift of positive Cd ions from the CdTe-oxide interface into water. The penetration of Na and erosion of CdTe immersed in saturated NaCl solution was investigated by secondary ion mass spectrometry measurements on samples treated in NaCl solution for different time intervals. Very low determined diffusion coefficient of Na was explained by trapping of Na on acceptor-type defects in Cd sublattice.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Projekt

<a href="/cs/project/GA16-23165S" target="_blank" >GA16-23165S: Příprava elektrických kontaktů na detektorech záření CdTe a CdZnTe</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2019

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Thin Solid Films

ISSN

0040-6090

e-ISSN

—

Svazek periodika

686

Číslo periodika v rámci svazku

6

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

6

Strana od-do

137426

Kód UT WoS článku

000480474400015

EID výsledku v databázi Scopus

2-s2.0-85069920802