Spectral Dependencies of the Stretched Exponential Dispersion Factor and Photoluminescence Quantum Yield as a Common Feature of Nanocrystalline Si

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F19%3A10405417" target="_blank" >RIV/00216208:11320/19:10405417 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/61388971:_____/20:00540637 RIV/61388963:_____/20:00519385 RIV/00216208:11320/20:10405417

Výsledek na webu

<a href="https://verso.is.cuni.cz/pub/verso.fpl?fname=obd_publikace_handle&handle=BMHgnR3bvR" target="_blank" >https://verso.is.cuni.cz/pub/verso.fpl?fname=obd_publikace_handle&handle=BMHgnR3bvR</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1002/pssa.201900698" target="_blank" >10.1002/pssa.201900698</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Spectral Dependencies of the Stretched Exponential Dispersion Factor and Photoluminescence Quantum Yield as a Common Feature of Nanocrystalline Si

Popis výsledku v původním jazyce

Herein, the spectral dependencies of the dispersion factor beta (from the stretched exponential function) and photoluminescence (PL) quantum yield (QY) of silicon nanocrystals (Si NCs) are thoroughly studied. Spectrally resolved PL decay kinetics of Si NCs in both liquid and solid samples are measured and their corresponding distributions of rates are retrieved by means of the hybrid maximum-entropy method. This enables us to demonstrate a direct correlation of dispersion factor beta with the width of rate distribution. Here, the evidence of the same step-like spectral dependence of rate distribution widths (dispersion factor) for different forms of nanocrystalline silicon (including porous silicon and chemically synthesized Si NCs) is presented suggesting intrinsic (core-related) origin of rate distributions. Spectral dependence of normalized QY of Si NCs reveals two characteristic peaks with spectral positions at approximate to 1.42 and approximate to 1.68 eV. A similar peak in QY spectral dependence of CdSe quantum dots (QDs) is found, which suggests its common origin regardless the material of semiconductor QDs.

Název v anglickém jazyce

Spectral Dependencies of the Stretched Exponential Dispersion Factor and Photoluminescence Quantum Yield as a Common Feature of Nanocrystalline Si

Popis výsledku anglicky

Herein, the spectral dependencies of the dispersion factor beta (from the stretched exponential function) and photoluminescence (PL) quantum yield (QY) of silicon nanocrystals (Si NCs) are thoroughly studied. Spectrally resolved PL decay kinetics of Si NCs in both liquid and solid samples are measured and their corresponding distributions of rates are retrieved by means of the hybrid maximum-entropy method. This enables us to demonstrate a direct correlation of dispersion factor beta with the width of rate distribution. Here, the evidence of the same step-like spectral dependence of rate distribution widths (dispersion factor) for different forms of nanocrystalline silicon (including porous silicon and chemically synthesized Si NCs) is presented suggesting intrinsic (core-related) origin of rate distributions. Spectral dependence of normalized QY of Si NCs reveals two characteristic peaks with spectral positions at approximate to 1.42 and approximate to 1.68 eV. A similar peak in QY spectral dependence of CdSe quantum dots (QDs) is found, which suggests its common origin regardless the material of semiconductor QDs.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10306 - Optics (including laser optics and quantum optics)

Projekt

—

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2019

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Physica Status Solidi (A) Applications and Materials

ISSN

1862-6300

e-ISSN

—

Svazek periodika

2019

Číslo periodika v rámci svazku

prosinec

Stát vydavatele periodika

DE - Spolková republika Německo

Počet stran výsledku

12

Strana od-do

1900698

Kód UT WoS článku

000503019200001

EID výsledku v databázi Scopus

2-s2.0-85076765581