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Changes in the Structure, Magnetization, and Resistivity of BaFe12-xTixO19

Identifikátory výsledku

  • Kód výsledku v IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F21%3A10439227" target="_blank" >RIV/00216208:11320/21:10439227 - isvavai.cz</a>

  • Výsledek na webu

    <a href="https://verso.is.cuni.cz/pub/verso.fpl?fname=obd_publikace_handle&handle=A.2R5qj3Oi" target="_blank" >https://verso.is.cuni.cz/pub/verso.fpl?fname=obd_publikace_handle&handle=A.2R5qj3Oi</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1021/acsaelm.0c01081" target="_blank" >10.1021/acsaelm.0c01081</a>

Alternativní jazyky

  • Jazyk výsledku

    angličtina

  • Název v původním jazyce

    Changes in the Structure, Magnetization, and Resistivity of BaFe12-xTixO19

  • Popis výsledku v původním jazyce

    BaFe12-xTixO19 hexaferrites up to x = 2.00 were fabricated in an ordinary ceramic way. Crystal structure parameters were isothermally defined at 300 K from the powder XRD by the Rietveld technique. The cell constants have nonmonotonic concentration dependence with a local minimum of a similar to 5.886 angstrom and V similar to 698.75 angstrom(3) at x = 1.00. The occupation mechanism of the titanium cations is confirmed. The Mossbauer investigation confirms such localization of Ti4+. Magnetization vs field measurements were realized at 300 K. The law of approach to saturation (LAS) was applied to determine the magnetic loop characteristics. These values decrease almost monotonically with an increase in titanium concentration and temperature. The minimum magnetic values were obtained for x = 2.00 at 300 K. Ac resistivity had a nonmonotonic growth dependence. Minimum ac resistivity was fixed for x = 0.50 at 300 K. As the frequency increases, the ac resistivity decreases, as the value of the band gap. The real part of permittivity epsilon&apos; rises constantly with increasing temperature and falls with frequency increase for all of the compositions. Changes in the structure, magnetization, and ac resistivity of BaFe12-xTixO19 were made on the basis of changing charged states of iron ions and the occupation mechanism by titanium ions.

  • Název v anglickém jazyce

    Changes in the Structure, Magnetization, and Resistivity of BaFe12-xTixO19

  • Popis výsledku anglicky

    BaFe12-xTixO19 hexaferrites up to x = 2.00 were fabricated in an ordinary ceramic way. Crystal structure parameters were isothermally defined at 300 K from the powder XRD by the Rietveld technique. The cell constants have nonmonotonic concentration dependence with a local minimum of a similar to 5.886 angstrom and V similar to 698.75 angstrom(3) at x = 1.00. The occupation mechanism of the titanium cations is confirmed. The Mossbauer investigation confirms such localization of Ti4+. Magnetization vs field measurements were realized at 300 K. The law of approach to saturation (LAS) was applied to determine the magnetic loop characteristics. These values decrease almost monotonically with an increase in titanium concentration and temperature. The minimum magnetic values were obtained for x = 2.00 at 300 K. Ac resistivity had a nonmonotonic growth dependence. Minimum ac resistivity was fixed for x = 0.50 at 300 K. As the frequency increases, the ac resistivity decreases, as the value of the band gap. The real part of permittivity epsilon&apos; rises constantly with increasing temperature and falls with frequency increase for all of the compositions. Changes in the structure, magnetization, and ac resistivity of BaFe12-xTixO19 were made on the basis of changing charged states of iron ions and the occupation mechanism by titanium ions.

Klasifikace

  • Druh

    J<sub>imp</sub> - Článek v periodiku v databázi Web of Science

  • CEP obor

  • OECD FORD obor

    10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Návaznosti výsledku

  • Projekt

  • Návaznosti

    I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Ostatní

  • Rok uplatnění

    2021

  • Kód důvěrnosti údajů

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Údaje specifické pro druh výsledku

  • Název periodika

    ACS APPLIED ELECTRONIC MATERIALS

  • ISSN

    2637-6113

  • e-ISSN

  • Svazek periodika

    3

  • Číslo periodika v rámci svazku

    4

  • Stát vydavatele periodika

    US - Spojené státy americké

  • Počet stran výsledku

    11

  • Strana od-do

    1583-1593

  • Kód UT WoS článku

    000645434400007

  • EID výsledku v databázi Scopus

    2-s2.0-85103776317