Probing the Mechanical Properties of 2D Materials via Atomic-Force-Microscopy-Based Modulated Nanoindentation

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F24%3A10473329" target="_blank" >RIV/00216208:11320/24:10473329 - isvavai.cz</a>

Výsledek na webu

<a href="https://verso.is.cuni.cz/pub/verso.fpl?fname=obd_publikace_handle&handle=iov6RG28IQ" target="_blank" >https://verso.is.cuni.cz/pub/verso.fpl?fname=obd_publikace_handle&handle=iov6RG28IQ</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1002/smtd.202301043" target="_blank" >10.1002/smtd.202301043</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Probing the Mechanical Properties of 2D Materials via Atomic-Force-Microscopy-Based Modulated Nanoindentation

Popis výsledku v původním jazyce

As the field of low-dimensional materials (1D or 2D) grows and more complex and intriguing structures are continuing to be found, there is an emerging need for techniques to characterize the nanoscale mechanical properties of all kinds of 1D/2D materials, in particular in their most practical state: sitting on an underlying substrate. While traditional nanoindentation techniques cannot accurately determine the transverse Young&apos;s modulus at the necessary scale without large indentations depths and effects to and from the substrate, herein an atomic-force-microscopy-based modulated nanomechanical measurement technique with Angstrom-level resolution (MoNI/angstrom I) is presented. This technique enables non-destructive measurements of the out-of-plane elasticity of ultra-thin materials with resolution sufficient to eliminate any contributions from the substrate. This method is used to elucidate the multi-layer stiffness dependence of graphene deposited via chemical vapor deposition and discover a peak transverse modulus in two-layer graphene. While MoNI/angstrom I has been used toward great findings in the recent past, here all aspects of the implementation of the technique as well as the unique challenges in performing measurements at such small resolutions are encompassed. Modulated nanoindentation, or MoNI, is an atomic-force-microscopy-based nano-indentation technique for measuring the mechanical properties of 2D materials with angstrom and nN resolution. This technique is demonstrated on the measurement of the transverse Young&apos;s modulus and mechanical response of 2D graphene thin films with varying number of atomic layers.image

Název v anglickém jazyce

Probing the Mechanical Properties of 2D Materials via Atomic-Force-Microscopy-Based Modulated Nanoindentation

Popis výsledku anglicky

As the field of low-dimensional materials (1D or 2D) grows and more complex and intriguing structures are continuing to be found, there is an emerging need for techniques to characterize the nanoscale mechanical properties of all kinds of 1D/2D materials, in particular in their most practical state: sitting on an underlying substrate. While traditional nanoindentation techniques cannot accurately determine the transverse Young&apos;s modulus at the necessary scale without large indentations depths and effects to and from the substrate, herein an atomic-force-microscopy-based modulated nanomechanical measurement technique with Angstrom-level resolution (MoNI/angstrom I) is presented. This technique enables non-destructive measurements of the out-of-plane elasticity of ultra-thin materials with resolution sufficient to eliminate any contributions from the substrate. This method is used to elucidate the multi-layer stiffness dependence of graphene deposited via chemical vapor deposition and discover a peak transverse modulus in two-layer graphene. While MoNI/angstrom I has been used toward great findings in the recent past, here all aspects of the implementation of the technique as well as the unique challenges in performing measurements at such small resolutions are encompassed. Modulated nanoindentation, or MoNI, is an atomic-force-microscopy-based nano-indentation technique for measuring the mechanical properties of 2D materials with angstrom and nN resolution. This technique is demonstrated on the measurement of the transverse Young&apos;s modulus and mechanical response of 2D graphene thin films with varying number of atomic layers.image

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Projekt

—

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2024

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Small Methods

ISSN

2366-9608

e-ISSN

—

Svazek periodika

8

Číslo periodika v rámci svazku

3

Stát vydavatele periodika

DE - Spolková republika Německo

Počet stran výsledku

10

Strana od-do

2301043

Kód UT WoS článku

001108802000001

EID výsledku v databázi Scopus

2-s2.0-85178095975