X-ray diffracted intensity for double-reflection channel-cut Ge monochromators at extremely asymmetric diffraction conditions
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216224%3A14310%2F11%3A00054738" target="_blank" >RIV/00216224:14310/11:00054738 - isvavai.cz</a>
Výsledek na webu
<a href="http://scripts.iucr.org/cgi-bin/paper?S0021889811001439" target="_blank" >http://scripts.iucr.org/cgi-bin/paper?S0021889811001439</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1107/S0021889811001439" target="_blank" >10.1107/S0021889811001439</a>
Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
X-ray diffracted intensity for double-reflection channel-cut Ge monochromators at extremely asymmetric diffraction conditions
Popis výsledku v původním jazyce
The width and integrated intensity of the 220 X-ray double-diffraction profile and the shift of the Bragg condition due to refraction have been measured in a channel-cut Ge crystal in an angular range near the critical angle of total external reflection.The Bragg angle and incidence condition were varied by changing the X-ray energy. In agreement with the extended dynamical theory of X-ray diffraction, the integrated intensity of the double diffraction remained almost constant, even for the grazing-incidence condition very close to the critical angle for total external reflection. A broadening of the diffraction profile not predicted by the extended theory of X-ray diffraction was observed when the Bragg condition was at angles of incidence lower than0.6 deg. Plane wave topographs revealed a contrast that could be explained by a slight residual crystal surface undulation of 0.3 deg due to etching to remove the cutting damage and the increasing effect of refraction at small glancing a
Název v anglickém jazyce
X-ray diffracted intensity for double-reflection channel-cut Ge monochromators at extremely asymmetric diffraction conditions
Popis výsledku anglicky
The width and integrated intensity of the 220 X-ray double-diffraction profile and the shift of the Bragg condition due to refraction have been measured in a channel-cut Ge crystal in an angular range near the critical angle of total external reflection.The Bragg angle and incidence condition were varied by changing the X-ray energy. In agreement with the extended dynamical theory of X-ray diffraction, the integrated intensity of the double diffraction remained almost constant, even for the grazing-incidence condition very close to the critical angle for total external reflection. A broadening of the diffraction profile not predicted by the extended theory of X-ray diffraction was observed when the Bragg condition was at angles of incidence lower than0.6 deg. Plane wave topographs revealed a contrast that could be explained by a slight residual crystal surface undulation of 0.3 deg due to etching to remove the cutting damage and the increasing effect of refraction at small glancing a
Klasifikace
Druh
J<sub>x</sub> - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
CEP obor
BM - Fyzika pevných látek a magnetismus
OECD FORD obor
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Návaznosti výsledku
Projekt
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Návaznosti
Z - Vyzkumny zamer (s odkazem do CEZ)<br>S - Specificky vyzkum na vysokych skolach<br>I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Ostatní
Rok uplatnění
2011
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Údaje specifické pro druh výsledku
Název periodika
Journal of Applied Crystallography
ISSN
0021-8898
e-ISSN
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Svazek periodika
44
Číslo periodika v rámci svazku
44
Stát vydavatele periodika
GB - Spojené království Velké Británie a Severního Irska
Počet stran výsledku
6
Strana od-do
353-358
Kód UT WoS článku
000288758500012
EID výsledku v databázi Scopus
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