Optical quantities of multi-layer systems with randomly rough boundaries calculated using the exact approach of the Rayleigh–Rice theory

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216224%3A14310%2F18%3A00103626" target="_blank" >RIV/00216224:14310/18:00103626 - isvavai.cz</a>

Výsledek na webu

<a href="https://www.tandfonline.com/doi/full/10.1080/09500340.2018.1457187" target="_blank" >https://www.tandfonline.com/doi/full/10.1080/09500340.2018.1457187</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1080/09500340.2018.1457187" target="_blank" >10.1080/09500340.2018.1457187</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Optical quantities of multi-layer systems with randomly rough boundaries calculated using the exact approach of the Rayleigh–Rice theory

Popis výsledku v původním jazyce

In this paper the exact approach of the Rayleigh–Rice theory enabling us to calculate optical quantities of multi-layer systems with boundaries exhibiting slight random roughness is presented. This approach is exact in the sense that it takes into account the propagation of perturbed electromagnetic fields (waves) among randomly rough boundaries including all cross-correlation and auto-correlation effects. The restriction to the second order of perturbation, which is the lowest order that gives nonzero corrections to coherent waves (obeying the Snell’s law), represents the only approximation used in our calculations. It is assumed that the layers and the substrates are formed by optically homogeneous and isotropic materials. The formulae obtained in the theoretical part are used to investigate the influence of layer thicknesses and roughness parameters on reflectances and associated ellipsometric parameters of the selected numerical examples of a three-layer system. The presented approach represents the generalization of the exact approach for single-layer systems and the improvement of the approximate approach for multi-layer systems published earlier. The exact approach of the RRT has a substantial importance for the optical characterization of multi-layer systems occurring in applied research and optics industry applications.

Název v anglickém jazyce

Optical quantities of multi-layer systems with randomly rough boundaries calculated using the exact approach of the Rayleigh–Rice theory

Popis výsledku anglicky

In this paper the exact approach of the Rayleigh–Rice theory enabling us to calculate optical quantities of multi-layer systems with boundaries exhibiting slight random roughness is presented. This approach is exact in the sense that it takes into account the propagation of perturbed electromagnetic fields (waves) among randomly rough boundaries including all cross-correlation and auto-correlation effects. The restriction to the second order of perturbation, which is the lowest order that gives nonzero corrections to coherent waves (obeying the Snell’s law), represents the only approximation used in our calculations. It is assumed that the layers and the substrates are formed by optically homogeneous and isotropic materials. The formulae obtained in the theoretical part are used to investigate the influence of layer thicknesses and roughness parameters on reflectances and associated ellipsometric parameters of the selected numerical examples of a three-layer system. The presented approach represents the generalization of the exact approach for single-layer systems and the improvement of the approximate approach for multi-layer systems published earlier. The exact approach of the RRT has a substantial importance for the optical characterization of multi-layer systems occurring in applied research and optics industry applications.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10306 - Optics (including laser optics and quantum optics)

Projekt

<a href="/cs/project/LO1411" target="_blank" >LO1411: Rozvoj centra pro nízkonákladové plazmové a nanotechnologické povrchové úpravy</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach

Rok uplatnění

2018

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Journal of modern optics

ISSN

0950-0340

e-ISSN

1362-3044

Svazek periodika

65

Číslo periodika v rámci svazku

14

Stát vydavatele periodika

GB - Spojené království Velké Británie a Severního Irska

Počet stran výsledku

17

Strana od-do

1720-1736

Kód UT WoS článku

000435121500010

EID výsledku v databázi Scopus

2-s2.0-85048549230