Data Analysis for Nanomaterials: Effective Medium Approximation, Its Limits and Implementations

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216224%3A14740%2F13%3A00068200" target="_blank" >RIV/00216224:14740/13:00068200 - isvavai.cz</a>

Výsledek na webu

<a href="http://www.springer.com/engineering/book/978-3-642-33955-4" target="_blank" >http://www.springer.com/engineering/book/978-3-642-33955-4</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1007/978-3-642-33956-1_3" target="_blank" >10.1007/978-3-642-33956-1_3</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Data Analysis for Nanomaterials: Effective Medium Approximation, Its Limits and Implementations

Popis výsledku v původním jazyce

We review here basic theoretical approaches to the optical response of nanostructured materials. We use the well established framework of Effective medium approximation (EMA) and discuss key issues of its use. The treatment of this extensive subject is adapted to the needs of ellipsometric/polarimetric measurements on nanostructured materials. In Sects. 3.1 and 3.2 we formulate the problems and establish notation. Then, we recall and discuss, in Sects. 3.3 and 3.4, several well-known formulae for the effective dielectric function. Sections 3.5 and 3.6 are devoted to a fairly detailed comparison of selected measured data with results of the EMA models. We also assess the uncertainties involved in the EMA approach by visualizing the differences between results of its different versions (Sect. 3.7) and by calculating the differences from exact solutions (Sect. 3.8). Finally, Sect. 3.9 is devoted to the discussion of possible resonant behaviour of EMA mixtures.

Název v anglickém jazyce

Data Analysis for Nanomaterials: Effective Medium Approximation, Its Limits and Implementations

Popis výsledku anglicky

We review here basic theoretical approaches to the optical response of nanostructured materials. We use the well established framework of Effective medium approximation (EMA) and discuss key issues of its use. The treatment of this extensive subject is adapted to the needs of ellipsometric/polarimetric measurements on nanostructured materials. In Sects. 3.1 and 3.2 we formulate the problems and establish notation. Then, we recall and discuss, in Sects. 3.3 and 3.4, several well-known formulae for the effective dielectric function. Sections 3.5 and 3.6 are devoted to a fairly detailed comparison of selected measured data with results of the EMA models. We also assess the uncertainties involved in the EMA approach by visualizing the differences between results of its different versions (Sect. 3.7) and by calculating the differences from exact solutions (Sect. 3.8). Finally, Sect. 3.9 is devoted to the discussion of possible resonant behaviour of EMA mixtures.

Druh

C - Kapitola v odborné knize

CEP obor

BM - Fyzika pevných látek a magnetismus

OECD FORD obor

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Projekt

<a href="/cs/project/ED1.1.00%2F02.0068" target="_blank" >ED1.1.00/02.0068: CEITEC - central european institute of technology</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2013

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název knihy nebo sborníku

Ellipsometry at the Nanoscale

ISBN

9783642339554

Počet stran výsledku

34

Strana od-do

145-178

Počet stran knihy

730

Název nakladatele

Springer

Místo vydání

Berlin

Kód UT WoS kapitoly

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