Laser desorption ionization time-of-flight mass spectrometry of GexSe1-x chalcogenide glasses, their thin films, and Ge:Se mixtures
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216275%3A25310%2F19%3A39915091" target="_blank" >RIV/00216275:25310/19:39915091 - isvavai.cz</a>
Nalezeny alternativní kódy
RIV/00216224:14310/19:00107304
Výsledek na webu
<a href="https://www.sciencedirect.com/science/article/pii/S0022309319300365" target="_blank" >https://www.sciencedirect.com/science/article/pii/S0022309319300365</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.jnoncrysol.2018.12.020" target="_blank" >10.1016/j.jnoncrysol.2018.12.020</a>
Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
Laser desorption ionization time-of-flight mass spectrometry of GexSe1-x chalcogenide glasses, their thin films, and Ge:Se mixtures
Popis výsledku v původním jazyce
The aim of this work is to generate and study the clusters formed as a result of the interaction of laser pulses with solid state materials such as chalcogenide glasses. The other target is to determine the stoichiometry of the clusters generated from studied chalcogenide glasses and their thin films in order to get the information about structural fragments presents in the plasma plume. The aims were achieved by exploiting laser desorption ionization (LDI) with quadrupole ion trap time-of-flight mass spectrometry (TOFMS) examination of the GexSe1-x (x = 0.1, 0.2, 0.3, 0.33) chalcogenide glasses and Ge0.2Se0.8 and Ge0.33Se0.67 thin films prepared by magnetron sputtering. The interaction of laser pulses with GexSe1-x chalcogenide glasses and their thin films produces many positively and negatively charged unary and binary (Ge-a(+/-), Se-b(+/-), and GeaSeb+/- clusters. About similar to 50 different clusters were identified for each glass sample. The results were compared with LDI TOFMS analysis of Ge:Se elemental mixtures.
Název v anglickém jazyce
Laser desorption ionization time-of-flight mass spectrometry of GexSe1-x chalcogenide glasses, their thin films, and Ge:Se mixtures
Popis výsledku anglicky
The aim of this work is to generate and study the clusters formed as a result of the interaction of laser pulses with solid state materials such as chalcogenide glasses. The other target is to determine the stoichiometry of the clusters generated from studied chalcogenide glasses and their thin films in order to get the information about structural fragments presents in the plasma plume. The aims were achieved by exploiting laser desorption ionization (LDI) with quadrupole ion trap time-of-flight mass spectrometry (TOFMS) examination of the GexSe1-x (x = 0.1, 0.2, 0.3, 0.33) chalcogenide glasses and Ge0.2Se0.8 and Ge0.33Se0.67 thin films prepared by magnetron sputtering. The interaction of laser pulses with GexSe1-x chalcogenide glasses and their thin films produces many positively and negatively charged unary and binary (Ge-a(+/-), Se-b(+/-), and GeaSeb+/- clusters. About similar to 50 different clusters were identified for each glass sample. The results were compared with LDI TOFMS analysis of Ge:Se elemental mixtures.
Klasifikace
Druh
J<sub>imp</sub> - Článek v periodiku v databázi Web of Science
CEP obor
—
OECD FORD obor
20506 - Coating and films
Návaznosti výsledku
Projekt
Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.
Návaznosti
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Ostatní
Rok uplatnění
2019
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Údaje specifické pro druh výsledku
Název periodika
Journal of Non-Crystalline Solids
ISSN
0022-3093
e-ISSN
—
Svazek periodika
509
Číslo periodika v rámci svazku
April
Stát vydavatele periodika
NL - Nizozemsko
Počet stran výsledku
9
Strana od-do
65-73
Kód UT WoS článku
000461531000009
EID výsledku v databázi Scopus
—