Deposition and characterization of solution processed Se-rich Ge-Se thin films with specular optical quality using multi-component solvent approach

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216275%3A25310%2F20%3A39916185" target="_blank" >RIV/00216275:25310/20:39916185 - isvavai.cz</a>

Výsledek na webu

<a href="https://www.osapublishing.org/ome/fulltext.cfm?uri=ome-10-11-2973&id=441867" target="_blank" >https://www.osapublishing.org/ome/fulltext.cfm?uri=ome-10-11-2973&id=441867</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1364/OME.408327" target="_blank" >10.1364/OME.408327</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Deposition and characterization of solution processed Se-rich Ge-Se thin films with specular optical quality using multi-component solvent approach

Popis výsledku v původním jazyce

The Ge25Se75, Ge20Se80 and Ge15Se85 thin films were deposited in specular optical quality from n-propylamine - methanol solvent mixture by spin-coating technique. As-prepared solution processed thin films were thermally stabilized to reduce the content of organic solvent residuals and optical properties, surface topography, composition, structure and chemical resistance of prepared Ge-Se thin films were studied in dependence of annealing temperature. Suitable thermal stabilization temperatures were found for each studied chalcogenide glass composition with respect to maintaining of thin films’ low surface roughness and targeted elemental composition. Stabilized thin films exhibited high refractive index, high chemical resistance, low surface roughness and structure close to source bulk glasses. The experiments proved that used n-propylamine - methanol solvent offered suitable way for preparation of high optical quality Ge-Se thin films by solution based deposition route.

Název v anglickém jazyce

Deposition and characterization of solution processed Se-rich Ge-Se thin films with specular optical quality using multi-component solvent approach

Popis výsledku anglicky

The Ge25Se75, Ge20Se80 and Ge15Se85 thin films were deposited in specular optical quality from n-propylamine - methanol solvent mixture by spin-coating technique. As-prepared solution processed thin films were thermally stabilized to reduce the content of organic solvent residuals and optical properties, surface topography, composition, structure and chemical resistance of prepared Ge-Se thin films were studied in dependence of annealing temperature. Suitable thermal stabilization temperatures were found for each studied chalcogenide glass composition with respect to maintaining of thin films’ low surface roughness and targeted elemental composition. Stabilized thin films exhibited high refractive index, high chemical resistance, low surface roughness and structure close to source bulk glasses. The experiments proved that used n-propylamine - methanol solvent offered suitable way for preparation of high optical quality Ge-Se thin films by solution based deposition route.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10306 - Optics (including laser optics and quantum optics)

Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach

Rok uplatnění

2020

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Optical Materials Express

ISSN

2159-3930

e-ISSN

2159-3930

Svazek periodika

10

Číslo periodika v rámci svazku

11/1

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

14

Strana od-do

2973-2986

Kód UT WoS článku

000583373100022

EID výsledku v databázi Scopus

2-s2.0-85096832200