Surface analysis, oxidation resistance, and embossing of Ge-based solution-processed thin films as materials for high refractive index optical elements

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216275%3A25310%2F24%3A39921696" target="_blank" >RIV/00216275:25310/24:39921696 - isvavai.cz</a>

Výsledek na webu

<a href="https://www.sciencedirect.com/science/article/pii/S0169433224014570" target="_blank" >https://www.sciencedirect.com/science/article/pii/S0169433224014570</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.apsusc.2024.160744" target="_blank" >10.1016/j.apsusc.2024.160744</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Surface analysis, oxidation resistance, and embossing of Ge-based solution-processed thin films as materials for high refractive index optical elements

Popis výsledku v původním jazyce

The solution-processing of chalcogenides offers a cheap route for potential mass production of high refractive index optical elements. Especially germanium-based glasses are perspective materials, but crucial information about their stability and patterning possibility was still missing. In this study, the Ge25S75, Ge20Sb5S75, Ge25Se75, and Ge20Sb5Se75 amorphous thin films were deposited in specular optical quality. The X-ray photoelectron spectroscopy (XPS) and Energy-dispersive X-ray spectroscopy (EDX) analysis revealed a significantly chalcogendepleted surface with metal over-stoichiometry, while the overall composition was still close to the targeted one. The oxidation resistance of studied samples was compared by their exposure to atmospheric conditions. The XPS proved that their resistance is strongly compositional dependent and rises as follows: Ge25S75 &lt; Ge20Sb5S75 &lt; Ge25Se75 &lt; Ge20Sb5Se75. The analysis also showed the presence of amorphous thin layer of germanium oxides. The thin films were also utilized for the fabrication of diffraction gratings using a soft stamp hot embossing method. Samples were structured in a wide range of temperatures (with respect to T-g) and analyzed by atomic force microscopy (AFM) and EDX. Results demonstrated that selenides are more suitable for hot embossing as they provide gratings with higher depth and more stable composition, while sulfides exhibited significant chalcogen loss.

Název v anglickém jazyce

Surface analysis, oxidation resistance, and embossing of Ge-based solution-processed thin films as materials for high refractive index optical elements

Popis výsledku anglicky

The solution-processing of chalcogenides offers a cheap route for potential mass production of high refractive index optical elements. Especially germanium-based glasses are perspective materials, but crucial information about their stability and patterning possibility was still missing. In this study, the Ge25S75, Ge20Sb5S75, Ge25Se75, and Ge20Sb5Se75 amorphous thin films were deposited in specular optical quality. The X-ray photoelectron spectroscopy (XPS) and Energy-dispersive X-ray spectroscopy (EDX) analysis revealed a significantly chalcogendepleted surface with metal over-stoichiometry, while the overall composition was still close to the targeted one. The oxidation resistance of studied samples was compared by their exposure to atmospheric conditions. The XPS proved that their resistance is strongly compositional dependent and rises as follows: Ge25S75 &lt; Ge20Sb5S75 &lt; Ge25Se75 &lt; Ge20Sb5Se75. The analysis also showed the presence of amorphous thin layer of germanium oxides. The thin films were also utilized for the fabrication of diffraction gratings using a soft stamp hot embossing method. Samples were structured in a wide range of temperatures (with respect to T-g) and analyzed by atomic force microscopy (AFM) and EDX. Results demonstrated that selenides are more suitable for hot embossing as they provide gratings with higher depth and more stable composition, while sulfides exhibited significant chalcogen loss.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

20506 - Coating and films

Projekt

—

Návaznosti

S - Specificky vyzkum na vysokych skolach

Rok uplatnění

2024

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Applied Surface Science

ISSN

0169-4332

e-ISSN

1873-5584

Svazek periodika

672

Číslo periodika v rámci svazku

November 2024

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

18

Strana od-do

160744

Kód UT WoS článku

001279784000001

EID výsledku v databázi Scopus

2-s2.0-85199306104