Exfoliation of self-assembled 2D aluminum synthesized via magnetron sputtering

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216275%3A25310%2F24%3A39921794" target="_blank" >RIV/00216275:25310/24:39921794 - isvavai.cz</a>

Výsledek na webu

<a href="https://www.sciencedirect.com/science/article/abs/pii/S0040609024003584?via%3Dihub" target="_blank" >https://www.sciencedirect.com/science/article/abs/pii/S0040609024003584?via%3Dihub</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.tsf.2024.140557" target="_blank" >10.1016/j.tsf.2024.140557</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Exfoliation of self-assembled 2D aluminum synthesized via magnetron sputtering

Popis výsledku v původním jazyce

Two-dimensional materials have been rapidly developed in recent years. As a type of two-dimensional material, 2D metals exhibit many unique physical and chemical properties. Here, we prepared two-dimensional aluminum materials via magnetron sputtering. The layers were exfoliated via sonication and annealing methods (thermal exfoliation methods). After exfoliation, the layers were observed via optical microscopy, scanning electron microscopy and transmission electron microscopy. The atomic force microscopy results show that the thicknesses of the layers range from similar to 1 nm to similar to 45 nm. The simulation results supported those two-dimensional layers formed in a self-assembly process.

Název v anglickém jazyce

Exfoliation of self-assembled 2D aluminum synthesized via magnetron sputtering

Popis výsledku anglicky

Two-dimensional materials have been rapidly developed in recent years. As a type of two-dimensional material, 2D metals exhibit many unique physical and chemical properties. Here, we prepared two-dimensional aluminum materials via magnetron sputtering. The layers were exfoliated via sonication and annealing methods (thermal exfoliation methods). After exfoliation, the layers were observed via optical microscopy, scanning electron microscopy and transmission electron microscopy. The atomic force microscopy results show that the thicknesses of the layers range from similar to 1 nm to similar to 45 nm. The simulation results supported those two-dimensional layers formed in a self-assembly process.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

20500 - Materials engineering

Projekt

<a href="/cs/project/EF17_048%2F0007376" target="_blank" >EF17_048/0007376: Senzory s vysokou citlivostí a materiály s nízkou hustotou na bázi polymerních nanokompozitů-NANOMAT</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2024

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Thin Solid Films

ISSN

0040-6090

e-ISSN

1879-2731

Svazek periodika

808

Číslo periodika v rámci svazku

November 2024

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

6

Strana od-do

140557

Kód UT WoS článku

001350895000001

EID výsledku v databázi Scopus

2-s2.0-85207571827