Strain mapping by scanning low energy electron microscopy

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26210%2F10%3APU88560" target="_blank" >RIV/00216305:26210/10:PU88560 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Strain mapping by scanning low energy electron microscopy

Popis výsledku v původním jazyce

Various techniques exist which are capable of studying the material microstructure, the scanning electron microscopy (SEM), (scanning) transmission microscopy ((S)TEM) and focused ion beam (FIB) microscopy being perhaps the most known. A specific way tovisualizing the microstructure of polycrystalline materials at high spatial resolution, to achieve a high contrast between grains in polycrystals and very fast data acquisition, is to use the cathode lens (CL) mode in SEM. The CL mode in the SEM enablesus to observe specimens at arbitrary landing energies of the primary electrons and to detect slow but not only slow, high angle scattered electrons that carry mainly crystallographic contrast based on the electron channelling, mostly in the Mott scattering angular range. The material under investigation was a commercial purity copper prepared by equal channel angular pressing (ECAP) method using 8 passes, route Bc, namely in the as-pressed state and after annealing (in argon atmosphere,

Název v anglickém jazyce

Strain mapping by scanning low energy electron microscopy

Popis výsledku anglicky

Various techniques exist which are capable of studying the material microstructure, the scanning electron microscopy (SEM), (scanning) transmission microscopy ((S)TEM) and focused ion beam (FIB) microscopy being perhaps the most known. A specific way tovisualizing the microstructure of polycrystalline materials at high spatial resolution, to achieve a high contrast between grains in polycrystals and very fast data acquisition, is to use the cathode lens (CL) mode in SEM. The CL mode in the SEM enablesus to observe specimens at arbitrary landing energies of the primary electrons and to detect slow but not only slow, high angle scattered electrons that carry mainly crystallographic contrast based on the electron channelling, mostly in the Mott scattering angular range. The material under investigation was a commercial purity copper prepared by equal channel angular pressing (ECAP) method using 8 passes, route Bc, namely in the as-pressed state and after annealing (in argon atmosphere,

Druh

O - Ostatní výsledky

CEP obor

JG - Hutnictví, kovové materiály

OECD FORD obor

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Projekt

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Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)<br>S - Specificky vyzkum na vysokych skolach

Rok uplatnění

2010

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů