Quantitative analysis of calcium and fluorine by high-sensitivity low-energy ion scattering: Calcium fluoride

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26210%2F20%3APU137828" target="_blank" >RIV/00216305:26210/20:PU137828 - isvavai.cz</a>

Výsledek na webu

<a href="https://doi.org/10.1002/sia.6889" target="_blank" >https://doi.org/10.1002/sia.6889</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1002/sia.6889" target="_blank" >10.1002/sia.6889</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Quantitative analysis of calcium and fluorine by high-sensitivity low-energy ion scattering: Calcium fluoride

Popis výsledku v původním jazyce

Low-energy ion scattering (LEIS) probes the atomic composition of the outer surface. Well-defined reference samples are used for the quantitation. For elements like fluorine and calcium, it is not easy to find suitable, clean, and homogeneous references, since fluorine is a gas and calcium is a very reactive metal. In contrast to surface analytic techniques such as XPS, the extreme surface sensitivity of LEIS makes it difficult to use stable compounds like CaF(2)as reference, since these compounds are not homogeneous at the atomic scale. With LEIS, CaF(2)is not expected to show an atomic ratio F/Ca = 2.0. Thus, before CaF(2)can be used as reference, its atomic surface concentrations have to be determined. Here, 3-keV He(+)scattering by a LiF(001) single crystal, an evaporated layer of Ca, and a Cu foil are used as basic references. High-purity CaF(2)is available in two forms: a single crystal and a powder. For a practical reference, powders are preferred, since if bulk impurities segregate to the surface, they will be dispersed over a large surface area. It is found that both CaF2(111) and powder have similar F/Ca atomic ratios. This confirms the F termination for both samples. For the powder, the F and Ca signals are reduced by 0.77 +/- 0.03 in comparison with those for the single crystal. The atomic sensitivity factors and relative sensitivity factors have been determined for F, Ca, and Cu.

Název v anglickém jazyce

Quantitative analysis of calcium and fluorine by high-sensitivity low-energy ion scattering: Calcium fluoride

Popis výsledku anglicky

Low-energy ion scattering (LEIS) probes the atomic composition of the outer surface. Well-defined reference samples are used for the quantitation. For elements like fluorine and calcium, it is not easy to find suitable, clean, and homogeneous references, since fluorine is a gas and calcium is a very reactive metal. In contrast to surface analytic techniques such as XPS, the extreme surface sensitivity of LEIS makes it difficult to use stable compounds like CaF(2)as reference, since these compounds are not homogeneous at the atomic scale. With LEIS, CaF(2)is not expected to show an atomic ratio F/Ca = 2.0. Thus, before CaF(2)can be used as reference, its atomic surface concentrations have to be determined. Here, 3-keV He(+)scattering by a LiF(001) single crystal, an evaporated layer of Ca, and a Cu foil are used as basic references. High-purity CaF(2)is available in two forms: a single crystal and a powder. For a practical reference, powders are preferred, since if bulk impurities segregate to the surface, they will be dispersed over a large surface area. It is found that both CaF2(111) and powder have similar F/Ca atomic ratios. This confirms the F termination for both samples. For the powder, the F and Ca signals are reduced by 0.77 +/- 0.03 in comparison with those for the single crystal. The atomic sensitivity factors and relative sensitivity factors have been determined for F, Ca, and Cu.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10403 - Physical chemistry

Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2020

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Surface and Interface Analysis

ISSN

0142-2421

e-ISSN

1096-9918

Svazek periodika

52

Číslo periodika v rámci svazku

1

Stát vydavatele periodika

GB - Spojené království Velké Británie a Severního Irska

Počet stran výsledku

4

Strana od-do

1000-1003

Kód UT WoS článku

000575056400001

EID výsledku v databázi Scopus

2-s2.0-85092077797