Noise spectroscopy of thick film

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F02%3APU30669" target="_blank" >RIV/00216305:26220/02:PU30669 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Noise spectroscopy of thick film

Popis výsledku v původním jazyce

Fluctuations of current and light emission in electroluminescent lamps based of zinc sulfide phosphor powder embedded in a dielectric layer are presented. Noise sources are emission of electrons from localised levels in the gap, impact excitation and impact ionisation of luminiscence centers and radiative transition by hot carriers. Due to high electric field, partial discharges are also sources of current fluctuations. Crystal defects, such as pores, grain boundaries and dislocations may provide regionns, where a localised continuum of states bridges the energy gap and allow non-radiative recombination, which is related to current fluctuation. Noise spectroscopy is used to estimate the quality and reliability of thick electroluminiscent layers. In these devices, the overall efficiency is further degraded by absorption, internal reflection and other losses. Brightness versus applied voltage and frequency is used to describe the degradation process and correlation with noise spectral de

Název v anglickém jazyce

Noise spectroscopy of thick film

Popis výsledku anglicky

Fluctuations of current and light emission in electroluminescent lamps based of zinc sulfide phosphor powder embedded in a dielectric layer are presented. Noise sources are emission of electrons from localised levels in the gap, impact excitation and impact ionisation of luminiscence centers and radiative transition by hot carriers. Due to high electric field, partial discharges are also sources of current fluctuations. Crystal defects, such as pores, grain boundaries and dislocations may provide regionns, where a localised continuum of states bridges the energy gap and allow non-radiative recombination, which is related to current fluctuation. Noise spectroscopy is used to estimate the quality and reliability of thick electroluminiscent layers. In these devices, the overall efficiency is further degraded by absorption, internal reflection and other losses. Brightness versus applied voltage and frequency is used to describe the degradation process and correlation with noise spectral de

Druh

D - Stať ve sborníku

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

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Projekt

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Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2002

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

Noise and Non-linearity Testing of Modern Electronic Componets

ISBN

80-2389094-8

ISSN

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e-ISSN

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Počet stran výsledku

2

Strana od-do

71-72

Název nakladatele

Ing.Zdeněk Novotný, CSc.

Místo vydání

Brno

Místo konání akce

Brno

Datum konání akce

12. 9. 2001

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

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