Porovnání šumové spektroskopie a LBIC

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F04%3APU43752" target="_blank" >RIV/00216305:26220/04:PU43752 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/00216305:26110/04:PU44911

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

The Comparison between Noise Spectroscopy and LBIC

Popis výsledku v původním jazyce

The noise spectroscopy and LBIC are a pair of the useful methods to provide a non-destructive characterization on semiconductor materials and devices. The actual reliability of electronic devices is usually lower than the maximum theoretical value of reliability, depending on the attained manufacture level. It may be due to irregularities in manufacturing processes. The defects are the natural sources of the excess current and excess noise and they are responsible for the change of several measurable quuantities. LBIC measurement for solar cell local characterization has been developed and tested on mono-crystalline Si solar cells. A solar cell is illuminated by a focused laser. The response (current or potential) of the solar cell is measured at fixedconditions (during scanning). We have studied two groups of silicon solar cells: good and wrong standard parameters of solar cells. In this part we describe our study of comparison between noise spectroscopy and LBIC.

Název v anglickém jazyce

The Comparison between Noise Spectroscopy and LBIC

Popis výsledku anglicky

The noise spectroscopy and LBIC are a pair of the useful methods to provide a non-destructive characterization on semiconductor materials and devices. The actual reliability of electronic devices is usually lower than the maximum theoretical value of reliability, depending on the attained manufacture level. It may be due to irregularities in manufacturing processes. The defects are the natural sources of the excess current and excess noise and they are responsible for the change of several measurable quuantities. LBIC measurement for solar cell local characterization has been developed and tested on mono-crystalline Si solar cells. A solar cell is illuminated by a focused laser. The response (current or potential) of the solar cell is measured at fixedconditions (during scanning). We have studied two groups of silicon solar cells: good and wrong standard parameters of solar cells. In this part we describe our study of comparison between noise spectroscopy and LBIC.

Druh

D - Stať ve sborníku

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

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Projekt

<a href="/cs/project/GA102%2F04%2F0142" target="_blank" >GA102/04/0142: Šumová spektroskopie pro rychlé nedestruktivní testování kvality, spolehlivosti a životnosti solárních článků</a><br>

Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2004

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

The 11th Electronic Devices and Systems Conference

ISBN

80-214-2701-9

ISSN

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e-ISSN

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Počet stran výsledku

4

Strana od-do

454-457

Název nakladatele

MSD

Místo vydání

Brno

Místo konání akce

Brno

Datum konání akce

9. 9. 2004

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

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