Test Stand for Obtaining Power Transistors Switching Characteristics During Aging

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F17%3APU123860" target="_blank" >RIV/00216305:26220/17:PU123860 - isvavai.cz</a>

Výsledek na webu

<a href="https://ieeexplore.ieee.org/document/7977460" target="_blank" >https://ieeexplore.ieee.org/document/7977460</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1109/EEEIC.2017.7977460" target="_blank" >10.1109/EEEIC.2017.7977460</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Test Stand for Obtaining Power Transistors Switching Characteristics During Aging

Popis výsledku v původním jazyce

This paper aims to construction, control and implemented measurement method of laboratory stand in order to acquire insulated gate bipolar transistor transients. The transients waveforms are consequently used to obtain indicators of the transistor age. The lifetime tests of an insulated gate bipolar transistor are introduced. Consequently, a novel architecture of measuring stand in order to provide lifetime tests is designed. Also the control algorithm is presented. A fundamental part of this work is a method of measuring switching waveforms including a high frequency current. Acquired waveforms of transistor switching are presented. Finally, the trend of chosen aging indicator values was obtained from the acquired data. Namely the influence of aging on turn--off time was observed.

Název v anglickém jazyce

Test Stand for Obtaining Power Transistors Switching Characteristics During Aging

Popis výsledku anglicky

This paper aims to construction, control and implemented measurement method of laboratory stand in order to acquire insulated gate bipolar transistor transients. The transients waveforms are consequently used to obtain indicators of the transistor age. The lifetime tests of an insulated gate bipolar transistor are introduced. Consequently, a novel architecture of measuring stand in order to provide lifetime tests is designed. Also the control algorithm is presented. A fundamental part of this work is a method of measuring switching waveforms including a high frequency current. Acquired waveforms of transistor switching are presented. Finally, the trend of chosen aging indicator values was obtained from the acquired data. Namely the influence of aging on turn--off time was observed.

Druh

D - Stať ve sborníku

CEP obor

—

OECD FORD obor

20201 - Electrical and electronic engineering

Projekt

<a href="/cs/project/LO1210" target="_blank" >LO1210: Energie v podmínkách udržitelného rozvoje (EN-PUR)</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2017

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

Conference Proceedings 2017 IEEE International Conference on Environment and Electrical Engineering and 2017 IEEE Industrial and Commercial Power Systems Europe

ISBN

978-1-5386-3916-0

ISSN

—

e-ISSN

—

Počet stran výsledku

5

Strana od-do

393-397

Název nakladatele

Neuveden

Místo vydání

Milán, Italská republika

Místo konání akce

Milán

Datum konání akce

6. 6. 2017

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

000426764000064